Pulse-width modulation in defocused three-dimensional fringe projection

Ayubi, Gastón A.; Ayubi, Jaime A; Martino, J. Matías Di; Ferrari, José A.

doi:10.1364/ol.35.003682

Cited by 163 publications

(58 citation statements)

References 8 publications

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“…Moreover, since traditional, highly accurate calibration methods tolerate minor deviations from absolute focus, such a nearly focused system, if successful, could employ these calibration methods to produce 3-D measurements of high accuracy. In this endeavor, Ayubi et al [5] proposed modulating the squared binary structured patterns with sinusoidal pulse width modulation to shift the harmonics far away from the fundamental frequency. Thus, even slight deviations from focus (similar to low-pass filtering) could neutralize the harmonics and generate high-quality sinusoidal patterns.…”

mentioning

confidence: 99%

Three-dimensional profilometry with nearly focused binary phase-shifting algorithms

Ekstrand

Zhang

2011

Opt. Lett.

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confidence: 99%

Three-dimensional profilometry with nearly focused binary phase-shifting algorithms

Ekstrand

Zhang

2011

Opt. Lett.

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“…In order to solve the above problem, binary defocusing technology has been widely researched. The binary defocusing techniques have been proposed recently, including (SBM) [7], SPWM [8], OPWM [9], etc.…”

Section: Introductionmentioning

confidence: 99%

Three-dimensional measurement of object surface by using ellipse binary defocusing projection

2017

J. Eur. Opt. Soc.-Rapid Publ.

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Background: The accuracy of three-dimensional measurement of object surface is always affected by the nonlinear gamma of the projector. The defocusing binary projection can overcome the nonlinear gamma distortion of the projector and reduce the effect of high harmonics without gamma calibration. Although researches have already reduced the errors to get a clear sinusoidal curve, there still leave room for improvement, especially when wide stripes are applied during the measurement. Methods: This paper presents a kind of ellipse binary pattern. By analyzing the property and spectrum, the binary pattern can produce high quality sinusoidal curve and produce smaller errors. It has a better effect to use an ellipse pattern to overcome the nonlinear gamma distortion of the projector and it is suit to be used as wide stripes. Results: Simulation and comparison experiments plus three-step phase shifted method are conducted to verify feasibility and accuracy of this binary pattern. The experimental results have indicated that this binary pattern can increase the accuracy of 3D measurement and reduce phase errors caused by the nonlinear gamma of the projector. The defocusing ellipse pattern is superior to traditional methods. In addition, the defocusing binary stripe is robust and suit to measure object with large period.

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“…The recently proposed binary defocusing technique [1] and its variations [2,3] have demonstrated their superiorities over conventional sinusoidal fringe projection techniques for three-dimensional (3D) shape measurement. Yet, it is very difficult for them to produce high-quality 3D shape measurement when the fringe stripes are wide and when the projector is nearly focused [4].…”

Section: Introductionmentioning

confidence: 99%

“…The aforementioned improved binary defocusing techniques [2,3] are, after all, modifying the patterns in one dimension; yet the desired sinusoidal fringe patterns are two-dimensional (2D) in nature. This indicates that if the binary patterns are modified in both dimensions, better sinusoidal patterns could be generated.…”

Section: Introductionmentioning

confidence: 99%

Three-dimensional shape measurement with binary dithered patterns

2012

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The previously proposed binary defocusing technique and its variations have proven successful for highquality three-dimensional (3D) shape measurement when fringe stripes are relatively narrow, but they suffer if fringe stripes are wide. This paper proposes to utilize the binary dithering technique to conquer this challenge. Both simulation and experimental results show the phase error is always less than 0.6% even when the fringe stripes are wide and the projector is nearly focused. Disciplines Computer-Aided Engineering and Design | Mechanical Engineering CommentsThis article is from Applied Optics 51 (2012) The previously proposed binary defocusing technique and its variations have proven successful for high-quality three-dimensional (3D) shape measurement when fringe stripes are relatively narrow, but they suffer if fringe stripes are wide. This paper proposes to utilize the binary dithering technique to conquer this challenge. Both simulation and experimental results show the phase error is always less than 0.6% even when the fringe stripes are wide and the projector is nearly focused.

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Pulse-width modulation in defocused three-dimensional fringe projection

Cited by 163 publications

References 8 publications

Three-dimensional profilometry with nearly focused binary phase-shifting algorithms

Three-dimensional profilometry with nearly focused binary phase-shifting algorithms

Three-dimensional measurement of object surface by using ellipse binary defocusing projection

Three-dimensional shape measurement with binary dithered patterns

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