Three-dimensional profilometry with nearly focused binary phase-shifting algorithms

Ekstrand, Laura; Zhang, Song

doi:10.1364/ol.36.004518

Cited by 50 publications

(23 citation statements)

References 9 publications

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“…Here, the phase error was determined by taking the difference between the phase obtained by the proposed technologies and the phase obtained by binary patterns using a nine-step phase-shifting algorithm with a fringe period of T = 18 pixels, whose phase error was proved negligible due to the error caused high-order harmonics was automatically eliminated. 20 Figure 5(a) illustrates the results with the projector being nearly focused, from which we can see that the phase-optimized algorithm has better performance under this circumstance, which confirms our simulation results as shown in Fig. 4(a).…”

Section: Methodssupporting

confidence: 84%

Improve dithering technique for 3D shape measurement: phase vs intensity optimization

Dai

Zhang

2013

SPIE Proceedings

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This paper presents a thorough comparison between a phase-based and an intensity-based optimization method for 3D shape measurement with the binary dithering techniques. Since for a 3D shape measurement system utilizing digital fringe projection techniques, the phase quality ultimately determines the measurement quality, and thus these two methods are compared in phase domain. Both simulation and experiments find that the phase-based optimization method can generate high-quality phase under given conditions. However, this method is sensitive to the amount of blurring (or defocusing). On contrast, the intensity-based optimization method can consistently generate high-quality phase with various amounts of defocusing. Both experiments and simulations will be presented to compare these two optimization methods KeywordsFringe analysis, binary defocusing, 3-D shape measurement, dithering, optimization ABSTRACT This paper presents a thorough comparison between a phase-based and an intensity-based optimization method for 3D shape measurement with the binary dithering techniques. Since for a 3D shape measurement system utilizing digital fringe projection techniques, the phase quality ultimately determines the measurement quality, and thus these two methods are compared in phase domain. Both simulation and experiments find that the phase-based optimization method can generate high-quality phase under given conditions. However, this method is sensitive to the amount of blurring (or defocusing). On contrast, the intensity-based optimization method can consistently generate high-quality phase with various amounts of defocusing. Both experiments and simulations will be presented to compare these two optimization methods.

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Section: Methodssupporting

confidence: 84%

Improve dithering technique for 3D shape measurement: phase vs intensity optimization

Dai

Zhang

2013

SPIE Proceedings

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“…According to Ekstrand and Zhang [23], if a nine-step phaseshifting algorithm is applied, it is possible to perform high quality measurements even with nearly focused binary patterns. Ninestep phase-shifting approach can effectively reduce error caused by projector nonlinearity for sinusoidal pattern projection and high order harmonics due to binary patterns, and also suppress random noise from the camera.…”

Section: Binary Defocusing Techniquementioning

confidence: 99%

Microscopic structured light 3D profilometry: Binary defocusing technique vs. sinusoidal fringe projection

Zhang

2017

Optics and Lasers in Engineering

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“…17 We mainly use the standard-squared binary method to generate the narrowest fringe patterns, and the error-diffusion technique 18 to generate binary dithered patterns with the other fringe periods. For each measurement, the absolute phase map, denoted as Φ, is obtained from these fringe patterns.…”

Section: Least-square Phase-shifting Algorithmmentioning

confidence: 99%

Three-dimensional shape measurement with dual reference phase maps

2014

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Single reference-phase-based methods have been extensively utilized in digital fringe projection systems, yet they might not provide the maximum sensitivity given a hardware system configuration. This paper presents an innovative method to improve the measurement quality by utilizing two orthogonal phase maps. Specifically, two reference phase maps generated from horizontal and vertical (i.e., orthogonal) fringe patterns projected are combined into a vector reference phase map through a linear combination for depth extraction. The experiments have been conducted to verify the superiority of the proposed method over a conventional single reference-phase-based approach. Disciplines Computer-Aided Engineering and Design | Mechanical Engineering CommentsThis article is from Optical Engineering 53 (2014) Abstract. Single reference-phase-based methods have been extensively utilized in digital fringe projection systems, yet they might not provide the maximum sensitivity given a hardware system configuration. This paper presents an innovative method to improve the measurement quality by utilizing two orthogonal phase maps. Specifically, two reference phase maps generated from horizontal and vertical (i.e., orthogonal) fringe patterns projected are combined into a vector reference phase map through a linear combination for depth extraction. The experiments have been conducted to verify the superiority of the proposed method over a conventional single reference-phase-based approach.

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Three-dimensional profilometry with nearly focused binary phase-shifting algorithms

Cited by 50 publications

References 9 publications

Improve dithering technique for 3D shape measurement: phase vs intensity optimization

Improve dithering technique for 3D shape measurement: phase vs intensity optimization

Microscopic structured light 3D profilometry: Binary defocusing technique vs. sinusoidal fringe projection

Three-dimensional shape measurement with dual reference phase maps

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