The deposition of diamond layers from CH4-H2 microwave
discharge operating in pulsed mode has been achieved. It has been shown
that the variation of the time parameters of the process (frequency and
duty cycle) leads to noticeable modifications of the deposited layers.
From plasma diagnostic measurements, the change in plasma composition has
been determined and correlated with the quality and growth rate of the
diamond thin films. Particular attention has been paid to the
concentration of H-atoms, CH and C2 radicals and their evolution during
the discharge regime and the afterglow. Indeed, these species are well
known either as agents for graphite etching (H), or diamond precursors
(CHx imaged by CH) or graphite precursors (C2Hx imaged by C2).
Optimum values of the power pulse repetition rate (500 Hz) and duty cycle
(50%) have been found which are correlated with the variation of the
relative concentrations of H, CH and C2 with time, especially during
the afterglow. It has been shown that these optimum conditions correspond
to a minimization of C2 in the afterglow while H and CH concentrations
remain high enough to continue the diamond deposition process after the
power is switched off.