1971
DOI: 10.1007/bf01424087
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Pulse duration dependence of laser damage mechanisms

Abstract: A number of mechanisms for internal laser damage in transparent dielectrics are examined for pulse duration dependence and the results are compared with experimental measurements when possible. The differences in dependence on pulse duration and other variables from one mechanism to another suggest that different mechanisms may initiate damage in different parameter ranges. Experimental identification of these mechanisms will be aided by measuring the pulse duration dependence of the damage threshold.

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Cited by 38 publications
(16 citation statements)
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References 24 publications
(23 reference statements)
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“…We treat both the PD and the QD-heating as being instantaneous. As it comes to the QD-heating, the energy gap between Stark levels can be bridged by a single phonon, with time constant on the ps or sub-ps scale [36], [37]. After this timescale, the deposited QD-energy is (locally) in thermal equilibrium, and its effect on the phase of a propagating pulse is determined by the local temperature and the thermo-optic coefficient dn/dT.…”
Section: Methodsmentioning
confidence: 99%
“…We treat both the PD and the QD-heating as being instantaneous. As it comes to the QD-heating, the energy gap between Stark levels can be bridged by a single phonon, with time constant on the ps or sub-ps scale [36], [37]. After this timescale, the deposited QD-energy is (locally) in thermal equilibrium, and its effect on the phase of a propagating pulse is determined by the local temperature and the thermo-optic coefficient dn/dT.…”
Section: Methodsmentioning
confidence: 99%
“…Damage occurs through conventional heat deposition ( heating of the lattice), resulting in melting, boiling, or fracture of the dielectric material. Because the controlling rate is that of thermal conduction through the lattice, this model predicts 14,15 a t 1/2 dependence of the threshold fluence on pulse duration. This is in reasonably good agreement with numerous experiments 16 -23 in which a t a scaling with nominally 0.3 , a , 0.6 was observed in a variety of dielectric materials (including samples with defects) from 10 ps to more than 100 ns.…”
Section: Introductionmentioning
confidence: 99%
“…Indeed, this temporal scaling law has motivated many research groups in order to obtain information on the mechanisms responsible for laser-induced damage in dielectrics. Unlike the standard 0.5 value of x that has been demonstrated in a lot of materials by both experimental (Stuart et al, 1996) and simple physical considerations (Bliss, 1971;Wood, 2003), LID in KDP exhibits a lower value of x that is close to 0.35 at 3ω (Adams et al, 2005;Burnham et al, 2003). A first attempt has been made by Feit and co-workers to explain this deviation from 0.5 Trenholme et al, 2006).…”
Section: Dmt Modelmentioning
confidence: 93%