2011
DOI: 10.1103/physrevb.84.119905
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Publisher’s Note: Low-temperature dependence of the thermomagnetic transport properties of the SrTiO3/LaAlO3interface [Phys. Rev. B84, 075423 (2011)]

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Cited by 13 publications
(19 citation statements)
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“…At intermediate electron densities, Ref. 28 found that the conductivity of the high-density component is nearly independent of T (up to 30 K), while the conductivity of the lowdensity component drops by an order of magnitude. Similarly, Fig.…”
Section: Discussionmentioning
confidence: 99%
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“…At intermediate electron densities, Ref. 28 found that the conductivity of the high-density component is nearly independent of T (up to 30 K), while the conductivity of the lowdensity component drops by an order of magnitude. Similarly, Fig.…”
Section: Discussionmentioning
confidence: 99%
“…31 reports that for high electron densities, the high-mobility component of their electron gas comprises less than 10% of the total electron density, while Ref. 28 found that at intermediate densities the high-mobility component contains a third of the total electron density. Similarly, Fig.…”
Section: Discussionmentioning
confidence: 99%
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“…31 An anomalous low-T behavior of thermopower in LaAlO 3 /SrTiO 3 was also reported. 32 The first S measurement in the extended T = 4-300 K range 33 revealed the presence of an impressively narrow and deep peak (∼ 500 µV/K) below T =50 K, in striking contrast with the underlying diffusive regime which dictates a smooth and almost linear approach to zero with decreasing temperature. For assonance with the thermoelectric behavior of semiconductor-based quantum wells [34][35][36] , it was logical to attribute the peak to the phonon-drag effect, i.e.…”
Section: Introductionmentioning
confidence: 99%
“…28,29 The dependence on magnetic field of the low field R H for the different temperatures can be captured by the same two-band model (see Fig. 3) taking into account the temperature dependence of the scattering time (1/s ¼ 1/s e þ 1/s i, s e and s i being the elastic and the inelastic scattering times, respectively, and s i / T À2.8 , see Fig.…”
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confidence: 99%