Proposed design of axial injection system for the DC-280 cyclotron

Gulbekian, G. G.; Gikal, B. N.; Bekhterev, V. V.; Bogomolov, S. L.; Ефремов, А. А.; Ivanenko, Ivan; Kazarinov, N. Yu.; Kalagin, I. V.; Melnikov, V. N.; Osipov, Nikolay; Prokhorov, S. V.; Tikhomirov, A. V.; Khabarov, M. V.

doi:10.1134/s1547477114060028

Cited by 9 publications

(5 citation statements)

References 3 publications

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“…Calculations are done for geometry and operational parameters of DECRIS-PM source [8]. The source layout is shown in figure 1.…”

Section: Source Set-upmentioning

confidence: 99%

“…Here, the ion life time is plotted for different statistical weights of ions for the fixed electron density distribution. Increase in the weight results in decrease of the ion life time; the weight of 4.8×10 8 gives equal electron and ion loss times with the argon gas flow of 0.75 particle mA.…”

Section: General Description and Matching Of The Module Solutionsmentioning

confidence: 99%

“…Calculations are done for geometry and operational parameters of DECRIS-PM source [3]. The source chamber dimensions are 7 cm in diameter and 23 cm in length.…”

Section: Introductionmentioning

confidence: 99%

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Spatial distributions of plasma potential and density in electron cyclotron resonance ion source

Mironov

Bogomolov

Bondarchenko

et al. 2020

Plasma Sources Sci. Technol.

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The Numerical Advanced Model of Electron Cyclotron Resonance Ion Source (NAM-ECRIS) is applied for studies of the physical processes in the source. Solutions of separately operating electron and ion modules of NAM-ECRIS are matched in iterative way such as to obtain the spatial distributions of the plasma density and of the plasma potential. Results reveal the complicated profiles with the maximized plasma density close to the ECR surface and on the source axis. The ion-trapping potential dips are calculated to be on the level of ~(0.01-0.05) V being located at the plasma density maxima. The highly charged ions are also localized close to the ECR surface. The biased electrode effect is due to an "electron string" along the source axis formed by reflection of electrons from the biased electrode and the extraction aperture. The string makes profiles of the highly charged ions more peaked on the source axis, thus increasing the extracted ion currents.

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“…Calculations are done for geometry and operational parameters of DECRIS-PM source [8]. The source layout is shown in figure 1.…”

Section: Source Set-upmentioning

confidence: 99%

Section: General Description and Matching Of The Module Solutionsmentioning

confidence: 99%

See 1 more Smart Citation

Spatial distributions of plasma potential and density in electron cyclotron resonance ion source

Mironov

Bogomolov

Bondarchenko

et al. 2020

Plasma Sources Sci. Technol.

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“…Better understanding is obtained of the source reactions to changes in injected microwave power, gas flow and magnetic field profiles, of the gas-mixing, isotope anomaly, afterglow and others effects. As the next step, we calculate the extracted ion currents for variety of working elements injected into the DECRIS-PM source [4] (all-permanent magnet structure, 14.5 GHz microwave frequency).…”

Section: Introductionmentioning

confidence: 99%

Simulations of ECRIS performance for different working materials

et al. 2018

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Free parameters of Numerical Advanced Model of ECRIS (NAM-ECRIS) are selected such as to reproduce the experimental charge-state-distribution of the extracted argon ions for the DECRIS-PM source tuned to produce the maximized Ar8+ currents. Using these fixed parameters, we calculate the extracted currents for Kr, Xe and Bi ions in mix with oxygen, for Ca in mix with helium, and for pure O and He plasmas. Comparison is made with the experimental data, good correspondence is observed.

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“…The investigated source is the 14-GHz all-permanent magnet ECRIS designed for ion production for DC-280 cyclotron at FLNR JINR, Dubna [9]. The source is capable to produce up to (0.5-1) mA of Ar 8+ ions with around 500 W of injected microwave power, which makes it a good representative of its generation.…”

Section: A the Source Parametersmentioning

confidence: 99%

On optical properties of ion beams extracted from an electron cyclotron resonance ion source

Mironov¹,

Bogomolov²,

Bondarchenko³

et al. 2018

AIP Conference Proceedings

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Ion extraction from DECRIS-PM source is simulated by using initial distributions of ions at the extraction aperture obtained with NAM-ECRIS code. Threedimensional calculations of plasma emissive surface are done and ions are traced in the extraction region. The ion beam profiles show strong aberrations due to shape of plasma meniscus; hollow beam features are reproduced, as well as changes in profiles for different focusing conditions.It is argued elsewhere that the ions are pushed out of the beam axis by strong radial electric field resulted from incomplete neutralization of the beam space charge [4]. Also, it is conjectured that the plasma shape inside the source is such that most of ions are born outside the source axis leading to the hollow beam profiles generation directly at the extraction aperture [5].Hereby, we report on the results of dedicated numerical simulations of ion extraction from ECRIS, combining calculations of ion production in ECRIS by using NAM-ECRIS code [6,7,8] and three-dimensional calculations of plasma meniscus shape. Ions are injected from the meniscus into the beam line and traced until they reach the magnetic field-free region in front of the analyzing magnet, where the beam profiles are calculated for different strengths of the focusing solenoidal lens. The profiles are compared with the experimental results from [3] and good agreement is found between the calculations and experiments. Basing on the simulations, we come to conclusion that the observed peculiarities in profiles of ion beams are mainly determined by shape of the plasma meniscus.The paper is organized in the following way: first, we give details of DECRIS-PM source design and present the NAM-ECRIS calculations that result in ion beam profiles at the extraction aperture; as the second step, we describe the extraction region of the source and 3-D calculations of the plasma meniscus shape; the final section of the paper deals with ion tracing in magnetic and electric field in the source extraction region and with discussion of the obtained beam parameters. Ion production in DECRIS-PM A. The source parametersThe investigated source is the 14-GHz all-permanent magnet ECRIS designed for ion production for DC-280 cyclotron at FLNR JINR, Dubna [9]. The source is capable to produce up to (0.5-1) mA of Ar 8+ ions with around 500 W of injected microwave power, which makes it a good representative of its generation. The source chamber dimensions and magnetic field parameters are listed in Table 1.

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Proposed design of axial injection system for the DC-280 cyclotron

Cited by 9 publications

References 3 publications

Spatial distributions of plasma potential and density in electron cyclotron resonance ion source

Spatial distributions of plasma potential and density in electron cyclotron resonance ion source

Simulations of ECRIS performance for different working materials

On optical properties of ion beams extracted from an electron cyclotron resonance ion source

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