2008
DOI: 10.1103/physrevb.77.134507
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Properties of tunnel Josephson junctions with a ferromagnetic interlayer

Abstract: We investigate superconductor/insulator/ferromagnet/superconductor tunnel Josephson junctions in the dirty limit using the quasiclassical theory. We formulate a quantitative model describing the oscillations of critical current as a function of thickness of the ferromagnetic layer and use this model to fit recent experimental data. We also calculate quantitatively the density of states ͑DOS͒ in this type of junctions and compare DOS oscillations with those of the critical current.

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Cited by 56 publications
(102 citation statements)
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“…Expression (19) reproduces the well-known result previously obtained for single-domain SIFS structures [16]- [18] thereby demonstrating the independence of the critical current on the orientation of the domains magnetization vectors, if they are collinear oriented and the FF interface is fully opaque for electrons.…”
supporting
confidence: 66%
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“…Expression (19) reproduces the well-known result previously obtained for single-domain SIFS structures [16]- [18] thereby demonstrating the independence of the critical current on the orientation of the domains magnetization vectors, if they are collinear oriented and the FF interface is fully opaque for electrons.…”
supporting
confidence: 66%
“…For arbitrary values of the width of the magnetic domains to calculate the dependence of I C (d F ) is necessary to use the general expression (18). Figure 2 gives the I C (d F ) curves calculated for H = 10πT C , γ BF = 0 and for a set of widths W/ξ F .…”
mentioning
confidence: 99%
“…28 The properties of SIFS junctions have been intensively studied both experimentally [9][10][11][12][13][14][15][16][17][18] and theoretically. [28][29][30][31] However, properties of the quasiparticle current have received relatively little attention so far, although they can be very important for the description of SIFS junctions as possible elements of superconducting logic circuits.…”
Section: Introductionmentioning
confidence: 99%
“…2 b) depicts the IVCs for large and small (inset) ranges of bias current. As the electric transport is in the dirty limit [20], j c scales exponentially with the variation of d F . The polycrystalline structure of roomtemperature sputtered layers and the very low etching rate of NiCu led to a good control over ∆d F .…”
Section: A Uniformly Etched Junctionmentioning
confidence: 99%