Properties of transition metal-metalloid ferromagnetic thin films

Aboaf, J. A.; Kobliska, R. J.; Klokholm, E.

doi:10.1109/tmag.1978.1059923

Cited by 40 publications

(8 citation statements)

References 6 publications

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“…phous films, which disappears for crystallized samples. A similar behaviour was early found by Aboaf et al [5] in sputtered samples. Their results are also plotted in figure 1.…”

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confidence: 89%

SHORT RANGE ORDER IN ANNEALED Fe_xSi_1-x AMORPHOUS FILMS

et al. 1988

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Magnetic properties of as-prepared (sputtered) and annealed FexSi1-x (0.64 ≤ x ≤ 0.78) amorphous films deposited at room temperature, are interpreted in terms of chemical short-range order and compared with evaporated films deposited at 77 K. Low temperature (≤ 30 K) magnetization behaviour follows ; M (T) / M (0) = 1 - BT3/2 - CT5/2 with B = 1.5 x 10-2 K-3/2 ; C = -2.610 x-4 K-5/2. Related spin wave stiffness constant is D = 0.9 meV Å2

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“…phous films, which disappears for crystallized samples. A similar behaviour was early found by Aboaf et al [5] in sputtered samples. Their results are also plotted in figure 1.…”

supporting

confidence: 89%

SHORT RANGE ORDER IN ANNEALED Fe_xSi_1-x AMORPHOUS FILMS

et al. 1988

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“…In the past few years, the system made of FeSi/Si in its multiple forms, e.g., amorphous, polycrystalline, and epitaxial thin films, iron disilicides, multilayers, superlattices, etc., has drawn immense attention in the magnetism community, 15,19,[21][22][23][24][25][26][27][28][29][30][31][32][33] leading to a better understanding of interesting phenomena, as for example, the possibility of having antiferromagnetic interlayer coupling in FeSi/Si. Likewise, TBIS measurements also have evidenced the existence of different magnetic phases 21 in Fe x Si 1Ϫx /Si multilayers for 1.2 nmϽϽ3.5 nm with 0.60ϽxϽ0.80.…”

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confidence: 99%

Perpendicular anisotropy detected by transversely biased initial susceptibility via the magneto-optic Kerr effect inFexSi1−x<

et al. 1997

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We studied experimentally and theoretically the perpendicular anisotropy and the stripe-domain structure in both Fe x Si 1Ϫx thin films and Fe x Si 1Ϫx /Si multilayers, the latter being in the low-modulation-length regime (0.4 nmϽϽ7 nm). The experimental study was made by means of the transversely biased initial susceptibility t␤ via the magneto-optic Kerr effect. The samples under study were prepared by dc triode sputtering at T S ϭ300 K. It is found that the appearance of stripe domains is more pronounced for decreasing as x remains constant and may be caused by both the increase in effective magnetic thickness and the reduction in effective magnetization as decreases. For multilayers with ϭ0.4 nm, the observed field dependence of t␤ Ϫ1 is similar to that found in homogeneous thin films when weak stripe-domain structures arise as a consequence of the existence of perpendicular anisotropy K N . We propose a quasistatic one-dimensional model to explain the behavior of t␤ Ϫ1 when stripe domains are present, and we analyze the critical occurrence of stripe domains. We calculated the so-called pseudo-uniaxial anisotropy field H Ks , associated with the stripes, in two extreme cases: exchange-driven susceptibility or magnetic free poles ͑nonzero divergence in the bulk͒. The latter case agrees better with experiment. We found that perpendicular anisotropy is not exclusive of a well-defined multilayer structure; i.e., K N arises even when there are no interfaces in the volume. By setting the experimental saturation field H s ͑obtained by hysteresis loops͒ into our model, we obtain both the perpendicular anisotropy constant K N ϭ10 4 -10 5 J/m 3 and the critical thickness t c for the occurrence of a stripe-domain structure. Some possible sources of perpendicular anisotropy are discussed, for example, the associated isotropic compressive stress , whose contribution is found to be ͉K N ͉ magnetoel Ϸ1.5-4.5ϫ10 4 J/m 3 .

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“…Amongst ferromagnetic transition-metal-metalloid amorphous alloys, a-Fe,Si, -, is a simple system which has received considerable attention in a recent years (see, for example, Aboaf, Kobliska and Klokholm 1978, Shimada and Kojima 1978, Lucinsky and Baszynski 1984. A wealth of data on its structure (Mangin, Marchal, Rodmacq and Janot 1977), and its electronic and magneto-optic properties Marchal 1978, Afonso, Lagunas, Briones andGiron 1980) are available.…”

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confidence: 99%