Properties of Surface Metal Micromachined Rectangular Waveguide Operating Near 3 THz

Nordquist, Christopher; Wanke, Michael Clement; Rowen, Adam M.; Lew, Arrington, Christian; Grine, Albert D.; Fuller, Charles T.

doi:10.1109/jstqe.2010.2049095

Cited by 13 publications

(2 citation statements)

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“…It enables vector reflection coefficient measurements to be performed at any frequency by simply using a coherent source, a video detector, a rotation stage mounted on a translation stage and a few quasi-optical components assembled in a null-balance bridge configuration. The current contribution is, therefore, of much relevance to the metrology of quasi-optical measurement techniques which are much needed for the wider proliferation of THz technology [38]- [56]. Furthermore, the de-embedding technique may also be adapted for use in other measurement modalities across the sensing community.…”

Section: Discussionmentioning

confidence: 99%

One-Port De-Embedding Technique for the Quasi-Optical Characterization of Integrated Components

2013

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We describe a one-port de-embedding technique suitable for the quasi-optical characterization of terahertz integrated components at frequencies beyond the operational range of most vector network analyzers. This technique is also suitable when the manufacturing of precision terminations to sufficiently fine tolerances for the application of a TRL de-embedding technique is not possible. The technique is based on vector reflection measurements of a series of easily realizable test pieces. A theoretical analysis is presented for the precision of the technique when implemented using a quasi-optical null-balanced bridge reflectometer. The analysis takes into account quantization effects in the linear and angular encoders associated with the balancing procedure, as well as source power and detector noise equivalent power. The precision in measuring waveguide characteristic impedance and attenuation using this de-embedding technique is further analyzed after taking into account changes in the power coupled due to axial, rotational, and lateral alignment errors between the device under test and the instruments' test port. The analysis is based on the propagation of errors after assuming imperfect coupling of two fundamental Gaussian beams. The required precision in repositioning the samples at the instruments' test-port is discussed. Quasi-optical measurements using the de-embedding process for a WR-8 adjustable precision short at 125 GHz are presented. The de-embedding methodology may be extended to allow the determination of S-parameters of arbitrary two-port junctions. The measurement technique proposed should prove most useful above 325 GHz where there is a lack of measurement standards.

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Section: Discussionmentioning

confidence: 99%

One-Port De-Embedding Technique for the Quasi-Optical Characterization of Integrated Components

2013

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“…Involved waveguides showed 0.31 dB/mm-0.83 dB/mm in the range 0.75 THz-1.1 THz. In [371] frequencies as high as 3 THz are reached with a multilayer micromachined WR-0.3 (75 µm x 37.5 µm), being the losses at this frequency 1.3 dB/mm. Although these results are acceptable, the lack of suitability of the classical RWG for these high frequencies is a fact, because, apart of the losses increment caused by the dimensions reduction, assumed bulk conductivy of metals provide an oversimplified model, being real losses much higher than predicted [355].…”

Section: Metallic (Microwave) Waveguides and Transmission Linesmentioning

confidence: 97%

Analysis and design of efficient passive components for the millimeter-wave and THz bands

Verdú¹,

Antonio²

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To my parents, brother and sister."Success is peace of mind which is a direct result of self-satisfaction in knowing you made the effort to become the best of which you are capable."Jonh Wooden "Lo que con mucho trabajo se adquiere, más se ama." Aristóteles AgradecimientosLa realización de esta tesis ha implicado no pocos años de trabajo y esfuerzo. Durante este importante periodo de mi vida han sido muchas las personas han estado a mi lado, brindándome su apoyo, ayuda, cariño y amor. Ya sea de una forma u otra, todas estas personas han contribuido a que este trabajo haya sido posible dando como fruto esta tesis. A todos ellos, me gustaría dedicarles un agradecimiento muy especial de todo corazón.Sin duda alguna, debo dar las gracias en primer lugar a mi director de tesis Mariano Baquero. Mariano, has sido un padre para mí profesionalmente hablando. Te conocí como alumno en las clases de Microondas, en las cuales me abriste la puerta a un conocimiento que me fascinó.Recuerdo perfectamente cuando fui a verte para preguntarte si podrías dirigirme el Proyecto Final de Carrera, y desde ese año 2009 hemos estado trabajando juntos. Quiero agradecerte no sólo haberme dado la oportunidad de trabajar en cada momento en elárea que más me ha gustado, sino el haberte preocupado por mí a nivel personal, velando siempre por mis intereses, ayudándome a desarrollarme personal y profesionalmente. Extiendo en este sentido mi agradecimiento a Miguel Ferrando. Si Mariano es el padre, tu serías sin duda el abuelo. Sin tu ayuda, la beca para la realización de esta tesis y los proyectos que han respaldado la misma no hubieran sido posibles. Tu esfuerzo ha permitido que el Grupo de Radiación Electromagnética (GRE) esté hoy dónde esta y que sus miembros nos beneficiemos de un entorno de trabajo excelente, produciendo trabajo de calidad. Debo agradecerte también tus siempre innovadoras ideas, algunas de las cuales se han convertido en una realidad plasmada en esta tesis.Una mención especial merece Daniel Sánchez. Dani, aunque tu nombre no figure como co-director bien sabes que podría estarlo. Jamás podré agradecerte lo suficiente la ayuda que me has prestado. Cuántas horas dedicadas a enseñarme en un sin fin de aspectos sin esperar nada a cambio, apoyándome también en los momentos difíciles, siempre presentes en una tesis. Bien sabes que lo mismo has hecho con cada uno tus compañeros, por eso eres el pilar del GRE Dani.Otra persona a la que estoy muy agradecido es a Vicente Boria. Tu activa colaboración en la dirección de esta tesis ha sido indispensable para la consecución de los resultados más relevantes de la misma. Sugeriste muy acertadamente una estancia en la Queen's University of Belfast, y me abriste la puerta a nuevas líneas de investigación en las cuales seguimos trabajando actualmente. Gracias por preocuparte por mi a nivel profesional y personal.En elámbito anterior, extiendo los agradecimientos a todo el GRE. It is also very important for me to acknowledge Prof. Vince Fusco. Thank you for hosting me in your group in Belfast ...

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Radio Frequency Microelectromechanical Systems (RFMEMS)

Nordquist

Olsson

2014

Wiley Encyclopedia of Electrical and Electronics Engineering

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Radio frequency microelectromechanical system (RF MEMS) devices are microscale devices that achieve superior performance relative to other technologies by taking advantage of the accuracy, precision, materials, and miniaturization available through microfabrication. These devices use their mechanical and electrical properties to perform a specific RF electrical function such as switching, transmission, or filtering. RF MEMS has been a popular area of research since the early 1990s, and within the last several years, the technology has matured sufficiently for commercialization and use in commercial market systems.

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Properties of Surface Metal Micromachined Rectangular Waveguide Operating Near 3 THz

Cited by 13 publications

References 19 publications

One-Port De-Embedding Technique for the Quasi-Optical Characterization of Integrated Components

One-Port De-Embedding Technique for the Quasi-Optical Characterization of Integrated Components

Analysis and design of efficient passive components for the millimeter-wave and THz bands

Radio Frequency Microelectromechanical Systems (RFMEMS)

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