Properties of sialon ceramics evaluated by means of multifractal, surface stereometry and quantitative fractography techniques

Stach, Sebastian; Roskosz, S.; Cybo, Jerzy; Cwajna, Jan

doi:10.1016/j.matchar.2009.02.013

Cited by 24 publications

(18 citation statements)

References 8 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…In the modern approach from material applied science, nanostructure of materials can be characterized properly using quantitative descriptions. Two main approaches to describe the 3D engineering surface roughness: statistical 22,23 and fractal description 24,25 are used in 3D surface characterization. Traditional Euclidean geometry describes objects with integer dimensions: zero-dimensional points, one-dimensional lines and curves, two-dimensional surfaces such as planes, and three-dimensional solid objects like cubes and spheres.…”

Section: Fractal Theorymentioning

confidence: 99%

“…However, such complex structures geometry can be described using fractal geometry. 24,25 Fractal analysis has already been successfully used in di®erent¯elds in science and engineering. [26][27][28] In contrast to statistical analyses, the fractal analyses allow extracting different types of information from surface characteristics in accordance to their morphology, with high precision and low computational time.…”

Section: Fractal Theorymentioning

confidence: 99%

See 1 more Smart Citation

Surface Roughness Characterization of ZnO: TiO₂-Organic Blended Solar Cells Layers by Atomic Force Microscopy and Fractal Analysis

et al. 2014

Self Cite

View full text Add to dashboard Cite

The objective of this work is to quantitatively characterize the 3D complexity of ZnO:TiO 2organic blended solar cells layers by atomic force microscopy and fractal analysis. ZnO:TiO 2organic blended solar cells layers were investigated by AFM in tapping-mode in air, on square areas of 25 μm 2 . A detailed methodology for ZnO:TiO 2 -organic blended solar cells layers surface fractal characterization, which may be applied for AFM data, is presented. Detailed surface characterization of the surface topography was obtained using statistical parameters, according with ISO 25178-2: 2012. The fractal dimensions D f values (all with average AE standard deviation), obtained with morphological envelopes method, for: blend D1 (P3HT:PCBM:ZnO:TiO 2 blend with ratio 1:0.35:0.175:0.175 mg in 1 ml of Chlorobenzene) is D f ¼ 2:55 AE 0:01; and for blend D2 (P3HT:PCBM:ZnO:TiO 2 blend with ratio 1:0.55:0.075:0.075 mg in 1 ml of Chlorobenzene) is D f ¼ 2:45 AE 0:01. Denoting the ratios in 1 ml of Chlorobenzene with D1 and D2 articles. The 3D surface roughness of samples revealed a fractal structure at nanometer scale. Fractal and AFM analysis may assist manufacturers in developing ZnO:TiO 2 -organic blended ¶ Corresponding author. Financial disclosure: Neither author has a¯nancial or proprietary interest in any material or method mentioned. Int. J. Nanosci. 2014.13. Downloaded from www.worldscientific.com by NORTHWESTERN UNIVERSITY on 02/04/15. For personal use only.solar cells layers with better surface characteristics and provides di®erent yet complementary information to that o®ered by traditional surface statistical parameters.

show abstract

Section: Fractal Theorymentioning

confidence: 99%

Section: Fractal Theorymentioning

confidence: 99%

Surface Roughness Characterization of ZnO: TiO₂-Organic Blended Solar Cells Layers by Atomic Force Microscopy and Fractal Analysis

et al. 2014

Self Cite

View full text Add to dashboard Cite

show abstract

“…In our study, the multifractal analysis of the AFM files was performed for each region of interest (ROI), using the box counting method. The analysis was based on the original algorithm that has been previously described in detail in the literature [29,30].…”

Section: Multifractal Analysis Of the 3-d Surface Texturementioning

confidence: 99%

Multifractal characteristics of titanium nitride thin films

Ţălu

Stach

Valedbagi

et al. 2015

Materials Science-Poland

Self Cite

View full text Add to dashboard Cite

The study presents a multi-scale microstructural characterization of three-dimensional (3-D) micro-textured surface of titanium nitride (TiN) thin films prepared by reactive DC magnetron sputtering in correlation with substrate temperature variation. Topographical characterization of the surfaces, obtained by atomic force microscopy (AFM) analysis, was realized by an innovative multifractal method which may be applied for AFM data. The surface micromorphology demonstrates that the multifractal geometry of TiN thin films can be characterized at nanometer scale by the generalized dimensions D q and the singularity spectrum f(α). Furthermore, to improve the 3-D surface characterization according with ISO 25178-2:2012, the most relevant 3-D surface roughness parameters were calculated. To quantify the 3-D nanostructure surface of TiN thin films a multifractal approach was developed and validated, which can be used for the characterization of topographical changes due to the substrate temperature variation.

show abstract

“…In this study, the fractal analysis was applied to the original AFM files using an algorithm that has been previously described in detail [24][25][26]. On the other hand, the estimation of fractal dimension (determined by the morphological envelopes method) of the AFM images was carried out using MountainsMap ® Premium software version 7 [15].…”

Section: Fractal Analysis Of the 3-d Microtextured Surfacementioning

confidence: 99%

Surface morphology of titanium nitride thin films synthesized by DC reactive magnetron sputtering

Ţălu

Stach

Valedbagi

et al. 2015

Materials Science-Poland

Self Cite

View full text Add to dashboard Cite

In this paper the influence of temperature on the 3-D surface morphology of titanium nitride (TiN) thin films synthesized by DC reactive magnetron sputtering has been analyzed. The 3-D morphology variation of TiN thin films grown on p-type Si (100) wafers was investigated at four different deposition temperatures (473 K, 573 K, 673 K, 773 K) in order to evaluate the relation among the 3-D micro-textured surfaces. The 3-D surface morphology of TiN thin films was characterized by means of atomic force microscopy (AFM) and fractal analysis applied to the AFM data. The 3-D surface morphology revealed the fractal geometry of TiN thin films at nanometer scale. The global scale properties of 3-D surface geometry were quantitatively estimated using the fractal dimensions D, determined by the morphological envelopes method. The fractal dimension D increased with the substrate temperature variation from 2.36 (at 473 K) to 2.66 (at 673 K) and then decreased to 2.33 (at 773 K). The fractal analysis in correlation with the averaged power spectral density (surface) yielded better quantitative results of morphological changes in the TiN thin films caused by substrate temperature variations, which were more precise, detailed, coherent and reproducible. It can be inferred that fractal analysis can be easily applied for the investigation of morphology evolution of different film/substrate interface phases obtained using different thin-film technologies.

show abstract

Properties of sialon ceramics evaluated by means of multifractal, surface stereometry and quantitative fractography techniques

Cited by 24 publications

References 8 publications

Surface Roughness Characterization of ZnO: TiO₂-Organic Blended Solar Cells Layers by Atomic Force Microscopy and Fractal Analysis

Surface Roughness Characterization of ZnO: TiO₂-Organic Blended Solar Cells Layers by Atomic Force Microscopy and Fractal Analysis

Multifractal characteristics of titanium nitride thin films

Surface morphology of titanium nitride thin films synthesized by DC reactive magnetron sputtering

Contact Info

Product

Resources

About

Properties of sialon ceramics evaluated by means of multifractal, surface stereometry and quantitative fractography techniques

Cited by 24 publications

References 8 publications

Surface Roughness Characterization of ZnO: TiO2-Organic Blended Solar Cells Layers by Atomic Force Microscopy and Fractal Analysis

Surface Roughness Characterization of ZnO: TiO2-Organic Blended Solar Cells Layers by Atomic Force Microscopy and Fractal Analysis

Multifractal characteristics of titanium nitride thin films

Surface morphology of titanium nitride thin films synthesized by DC reactive magnetron sputtering

Contact Info

Product

Resources

About

Surface Roughness Characterization of ZnO: TiO₂-Organic Blended Solar Cells Layers by Atomic Force Microscopy and Fractal Analysis

Surface Roughness Characterization of ZnO: TiO₂-Organic Blended Solar Cells Layers by Atomic Force Microscopy and Fractal Analysis