1966
DOI: 10.1016/0038-1101(66)90085-2
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Properties of gold in silicon

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Cited by 308 publications
(95 citation statements)
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“…Diffusion of gold into bulk silicon at our VLS growth temperatures of 1000-1050°C leads to carrier lifetimes of Ͼ1 ns, 17 which combined with carrier mobilities expected for the observed dopant densities, 13,18 indicates minority carrier diffusion lengths of ജ1 m. This is in agreement with our near-field scanning optical microscope measurements of the minority carrier diffusion length of Aucatalyzed Si wires. 13 As shown in the present work, photolithography is an ideal method for enabling uniform arrays of wires of this diameter to be grown over large areas.…”
supporting
confidence: 88%
“…Diffusion of gold into bulk silicon at our VLS growth temperatures of 1000-1050°C leads to carrier lifetimes of Ͼ1 ns, 17 which combined with carrier mobilities expected for the observed dopant densities, 13,18 indicates minority carrier diffusion lengths of ജ1 m. This is in agreement with our near-field scanning optical microscope measurements of the minority carrier diffusion length of Aucatalyzed Si wires. 13 As shown in the present work, photolithography is an ideal method for enabling uniform arrays of wires of this diameter to be grown over large areas.…”
supporting
confidence: 88%
“…This is expected, since Au forms a deep level trap within Si [10] while Ni remains relatively inert as long as it does not form a pre cipitate [12). This is encouraging from a photovoltaics perspective, given the difference between the abundance and costs of Au vs. Ni.…”
Section: Methodsmentioning
confidence: 81%
“…3). This low carrier concentration in the Si:Au layer is believed to be caused by the self-compensation due to the ionization of deep acceptor and donor trap levels of substitutional gold in silicon 41,52,53 . The resulting full depletion of the Si:Au causes the majority of the applied reverse bias voltage to drop across this layer, thereby facilitating carrier transport via drift.…”
Section: Discussionmentioning
confidence: 99%