1996
DOI: 10.1063/1.363524
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Properties of a submicrometer x-ray beam at the exit of a waveguide

Abstract: This report discusses the properties of a 13-keV submicrometer x-ray beam exiting from a waveguide. Waveguides for this spectral regime can be constructed by enclosing a low-absorbing material between highly absorbant metals. Best performance is found for about 0.1 μm guiding layer thickness. Measurements of the photon beam size close to the exit and of the intensity distribution far from the exit will be presented. From these data one derives a beam size at the exit which is identical to the guiding layer thi… Show more

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Cited by 89 publications
(48 citation statements)
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“…µXRD techniques are currently routinely employing beam sizes of a few µm for polymer sample thicknesses down to a few µm. Sub-µm beams, are, however, becoming available and ≤100 nm beams have been reported [9,10,11]. Those techniques usually require little preparation of the sample, in contrast with transmission electron diffraction/imaging (TED/TEM) techniques which provide beam sizes down to about 10 nm but require elaborate embedding and sectioning techniques [12,13].…”
Section: Synchrotron Radiation Optics and Instrumentationmentioning
confidence: 99%
“…µXRD techniques are currently routinely employing beam sizes of a few µm for polymer sample thicknesses down to a few µm. Sub-µm beams, are, however, becoming available and ≤100 nm beams have been reported [9,10,11]. Those techniques usually require little preparation of the sample, in contrast with transmission electron diffraction/imaging (TED/TEM) techniques which provide beam sizes down to about 10 nm but require elaborate embedding and sectioning techniques [12,13].…”
Section: Synchrotron Radiation Optics and Instrumentationmentioning
confidence: 99%
“…Our approach assumes that we calculate the equation of the one wall of the capillary and calculation of the situation inside capillary is done by the rotation. It is obvious, that the resignation of rotation means that one considers the grazing reflections on the X-ray mirror or on one-dimensional waveguides [38,39]. This aspect is also important, since we know that for the multilayer mirrors, a second and narrow maximum of reflectivity exists, for much greater but still small angles.…”
Section: Resultsmentioning
confidence: 99%
“…The`condenser' system in the presented projection microscope is formed by an X-ray waveguide (Feng et al, 1995;Jark et al, 1996), as presented in Fig. 1.…”
Section: Methodsmentioning
confidence: 99%