2017 International Symposium on Electromagnetic Compatibility - EMC EUROPE 2017
DOI: 10.1109/emceurope.2017.8094693
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Propagation methods for stochastic field emissions and source reconstruction

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Cited by 2 publications
(16 citation statements)
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“…When detected by probes, EM fields are perturbed by the probe structure itself. As explained in [ 50 ], a more subtle effect in NFS concerns the coupling of probes with the surface current density distribution flowing at the source surface. A correction factor can be evaluated by either dedicated experiments or simulations, which can be used to predict the transfer impedance between the field incident on the probe and the voltage read from its port [ 52 ].…”
Section: From Deterministic To Statistical Electromagnetic Theorymentioning
confidence: 99%
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“…When detected by probes, EM fields are perturbed by the probe structure itself. As explained in [ 50 ], a more subtle effect in NFS concerns the coupling of probes with the surface current density distribution flowing at the source surface. A correction factor can be evaluated by either dedicated experiments or simulations, which can be used to predict the transfer impedance between the field incident on the probe and the voltage read from its port [ 52 ].…”
Section: From Deterministic To Statistical Electromagnetic Theorymentioning
confidence: 99%
“…For statistical sources, it is therefore natural to consider correcting entries of the CT involving the correction factor. Nevertheless, it is shown through plane-wave expansion [ 53 ] and operator theory [ 50 ] that the propagation of probe voltage–voltage CFs is equivalent to the propagation of field–field CFs. A proposal for standardization of near-field measurement of stochastic EM fields led by the European COST Action 1407 has been initiated in [ 54 ].…”
Section: From Deterministic To Statistical Electromagnetic Theorymentioning
confidence: 99%
See 3 more Smart Citations