Prompt gamma-ray yields from proton bombardment of transition elements (Ti to Zn)

Demortier, G.

doi:10.1007/bf02519614

Cited by 27 publications

(2 citation statements)

References 23 publications

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“…The main contribution to the background is due to the Compton scattering within the detector of γ -rays produced in the primary target from nuclear reactions. At the proton energy used, the γ -rays having the higher thick target yield are due to the 52 Cr(p, γ ) 53 Mn nuclear reaction [29] with energies 378, 913 and 1290 keV respectively. This source of background together with the bremsstrahlung radiation produced in the targets due to the s1 and E m s2 correspond to the maximum RRS photon energies produced and are expressed as the differences between the energy of the exciting beam and of the Ce M-subshell binding energies U M IV,V and U M II,III respectively.…”

Section: Reduction Of Cross Sectionsmentioning

confidence: 99%

Measurement of KL and LM resonant Raman scattering cross sections with a proton-induced x-ray beam

Karydas¹,

Paradellis²

1997

J. Phys. B: At. Mol. Opt. Phys.

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The resonant Raman effect has been described as an inelastic scattering process occurring when the energy of the exciting x-ray beam approaches from below the energy of an absorption edge of a target element. It produces a scattered photon with a characteristic maximum energy and the emission of an inner-shell electron. A high monochromatic CrK α x-ray beam produced by protons was utilized for the measurement of the KL type of resonant Raman scattering (RRS) cross sections in V and Cr and of the LM ones in La and Ce. In the case of V and Cr targets, the fluorescence yields of the KL-RRS process were also extracted, while the fine-structure splitting in a LM-RRS spectrum was observed for the first time. The influence of RRS into different topics of x-ray spectrometry, like the quantitative x-ray flourescence analysis, the theoretical calculations of the mass attenuation coefficients or the shape of characteristic xrays emitted from low Z thick targets, is also discussed.

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Section: Reduction Of Cross Sectionsmentioning

confidence: 99%

Measurement of KL and LM resonant Raman scattering cross sections with a proton-induced x-ray beam

Karydas¹,

Paradellis²

1997

J. Phys. B: At. Mol. Opt. Phys.

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“…In fact, the majority of the background observed at the 3 MeV case is due to the intense 65 Cu(p, n) 65 Zn reaction opening above 2.168 MeV. 35 Detailed tables for the γ -ray production versus incident proton energy from thick targets have been published 26,27 and can be taken into consideration for optimizing the energy of protons (although accounting the complexity of such estimation, the best way is to follow an experimental procedure, i.e., changing the proton energy and recording the signal to background ratio). As a practical recommendation it could be suggested that an optimum proton energy is the one that the background due to γ -rays accounts only for a small fraction (∼10%) among the typical background contributions that a low Z scattered x-ray beam generates, including the incomplete charge collection component.…”

Section: Estimating the Proton-induced X-ray Beam Fluxmentioning

confidence: 99%

Proton induced quasi-monochromatic x-ray beams for soft x-ray spectroscopy studies and selective x-ray fluorescence analysis

Sokaras¹,

Zarkadas²,

Fliegauf³

et al. 2012

Review of Scientific Instruments

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We present the analytical features and performance of an x-ray spectroscopy end station of moderate energy resolution operating with proton-induced quasi-monochromatic x-ray beams. The apparatus was designed, installed and operated at the 5.5 MV Tandem VdG Accelerator Laboratory of the Institute of Nuclear Physics, N.C.S.R. "Demokritos," Athens. The setup includes a two-level ultrahigh vacuum chamber that hosts in the lower level up to six primary targets in a rotatable holder; there, the irradiation of pure element materials-used as primary targets-with few-MeV high current (~μA) proton beams produces intense quasi-monochromatic x-ray beams of selectable energy. In the chamber's upper level, a six-position rotatable sample holder hosts the targets considered for x-ray spectroscopy studies. The proton-induced x-ray beam, after proper collimation, is guided to the sample position whereas various filters can be also inserted along the beam's path to eliminate the backscattered protons or/and to absorb selectively components of the x-ray beam. The apparatus incorporates an ultrathin window Si(Li) spectrometer (FWHM 136 eV at 5.89 keV) coupled with low-noise electronics capable of efficiently detecting photons down to carbon Kα. Exemplary soft x-ray spectroscopy studies and results of selective x-ray fluorescence analysis are presented.

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Improvement of peak‐to‐background ratio in PIXE and XRF methods using thin Si‐PIN detectors

Karydas¹,

Zarkadas²,

Kyriakis³

et al. 2003

X-Ray Spectrometry

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This paper describes the peak‐to‐background ratio improvement that can be achieved in PIXE and XRF applications by the use of thin crystal detectors. This improvement becomes apparent in the presence of an intense γ‐ray source, which can be produced either during proton irradiation of a sample (PIXE) or in the deexcitation of the radionuclide in radioisotope‐induced XRF analysis (RIXRF). In order to study theoretically the energy response of a silicon crystal in the x‐ray energy region with respect to its thickness and the energy of the incident γ‐radiation, a Monte Carlo simulation was performed. Experimentally, two detectors having crystal thicknesses of 300 µm and 3 mm were employed in specific analytical applications of PIXE, PIXE‐induced XRF and RIXRF techniques. The peak‐to‐background ratios obtained for various characteristic x‐rays were compared between the two detectors. The performances of the two detectors were also compared in the monochromatic XRF analysis of samples with low average atomic number matrix content. Copyright © 2003 John Wiley & Sons, Ltd.

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Prompt gamma-ray yields from proton bombardment of transition elements (Ti to Zn)

Cited by 27 publications

References 23 publications

Measurement of KL and LM resonant Raman scattering cross sections with a proton-induced x-ray beam

Measurement of KL and LM resonant Raman scattering cross sections with a proton-induced x-ray beam

Proton induced quasi-monochromatic x-ray beams for soft x-ray spectroscopy studies and selective x-ray fluorescence analysis

Improvement of peak‐to‐background ratio in PIXE and XRF methods using thin Si‐PIN detectors

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