Small-angle
neutron scattering (SANS) is used to study the solution-phase
behavior of the well-studied n-type semiconducting polymer P(NDI2OD-T2).
To provide a global overview of polymer behavior, four different molecular
weight samples are studied in three different solvents and at three
different temperatures. The SANS data are interpreted in terms of
a hierarchical model combining a cylinder model to explain scattering
from individual rigid chains/aggregates at high scattering vector, q, and a Guinier–Porod model to explain the upturn
in scattering at low q that appears in the SANS patterns
of the higher molecular weight samples. In this way, the scattering
patterns of P(NDI2OD-T2) solutions with different molecular weights,
different solvents, and at different temperatures can all be adequately
modeled and parametrized in terms of varying cylinder length, cylinder
width, and mass fractal dimension. To connect the SANS results to
thin film microstructure and charge transport, thin films are prepared
and studied with atomic force microscopy and organic field effect
transistor (OFET) measurements. Significantly, excess network formation
in solution is associated with a decrease in the in-plane alignment
of polymer chains and decrease in OFET mobility. Thus, while increased
aggregation can enhance chain ordering and charge transport in thin
films, excess aggregation in the form of a compact entangled network
of these aggregates can be detrimental to the formation of ordered
structures during solution deposition.