Profiling the local carrier concentration across a semiconductor quantum dot

Walrath, Jenna; Lin, Yen-Hsiang; Huang, Simon; Goldman, R. S.

doi:10.1063/1.4919919

Cited by 2 publications

(1 citation statement)

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“…The question is therefore to which extent this charge transfer between metal and support proceeds and what the details of the final charge distribution are. We are not aware of any previous work in this direction, except for a scanning thermoelectric microscopy determination of the local carrier concentration across a semiconductor quantum dot, 19 and it is the aim of the present work to advance the information about the charge distribution and its influence on catalysis.…”

Section: Introductionmentioning

confidence: 99%

Charge Polarization at Catalytic Metal–Support Junctions. Part B: Theoretical Modeling of Kelvin Probe Force Microscopy

Kittel

Roduner

2016

J. Phys. Chem. C

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Existing models for the analysis of Kelvin probe microscopy experiments are extended and used to analyze the experimental electrical potential profiles for a Pt/TiO 2 model nanoparticle.The derived model reproduces in detail the Kelvin probe image that reveals a characteristic ring-shaped negative charge zone at the surface around the particle: A planar negative charge zone at the surface of the support extends beyond the diameter of the Pt particle. It is compensated mostly by a planar layer of positive charges in the metal across the interface, and by a smaller number of positive charges at the metal-air interface. These latter charges determine the positive electrical potential of the metal particle, and they are likely responsible for the extent of the metal-support interaction in catalytic reactions.

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Section: Introductionmentioning

confidence: 99%