Profiles of dislocation images in Si by scanning microscopy in EBIC. Dependence on the space charge cylinder radius

Castaldini, A.; Cavallini, A.; Gondi, P.

doi:10.1007/bf02451900

Il Nuovo Cimento D

1985

DOI: 10.1007/bf02451900

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Profiles of dislocation images in Si by scanning microscopy in EBIC. Dependence on the space charge cylinder radius

A. Castaldini

A. Cavallini

P. Gondi

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Profiles of dislocation images in Si by scanning microscopy in EBIC. Dependence on the space charge cylinder radius

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References 13 publications

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