Profile Analysis

Kern, A.

doi:10.1002/9781444305487.ch4

Cited by 4 publications

(1 citation statement)

References 29 publications

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“…The X-ray diffraction (XRD) analysis was performed at room temperature using a Philips-Panalytical PW 1710 diffractometer, with Cu Kα radiation and operating at 40 kV and 40 mA. The scan was performed over an angular range between 3.03° and 89.97° 2θ, with a scan step size of 0.060° 2θ and scan step time of 1 s. The diffractograms were analyzed using the TOPAS V6 software 53,54 . For estimation of the crystallite size (i.e.…”

Section: Methodsmentioning

confidence: 99%

Microstructure Evolution During the Sintering of Freeze-Cast Alumina

Athayde,

Lima,

Weidler

et al. 2024

Mat. Res.

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Reports on freeze-cast ceramic materials frequently focus on the study of the organized macroporosity and the properties of the materials. This study aims to describe the microstructure evolution of freeze-cast alumina during the sintering process, analyzing grain growth, densification, pore elimination and crystal structure at different sintering temperatures (1300-1500 °C). Aqueous suspensions with 20 vol% alumina were freeze-cast in liquid N 2 and sintered. The microstructure was analyzed by stereological analysis, N 2 adsorption and X-ray diffraction. Grain sizes varied within 237-500 nm, and the intergranular porosity decreased from 8.8% at 1300 °C to 1.4% at 1500 °C. N 2 isotherm analysis revealed pore shrinking from the region of macro and mesopores (20-80 nm), to smaller residual mesopores (3.7-15 nm) at temperatures above 1400 °C. Rietveld refinement of the XRD diffractograms confirmed increased crystallite size and decreased lattice strain at higher sintering temperatures. This comprehensive description of microstructural evolution of the freeze-cast alumina contributes to understanding the sintering of highly porous ceramics produced via freeze-casting.

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Section: Methodsmentioning

confidence: 99%