2013
DOI: 10.1016/j.apsusc.2013.09.043
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Production and characterization of layer by layer sputtered single-phase AgInSe2 thin film by thermal selenization

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Cited by 12 publications
(6 citation statements)
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“…Different values have been reported in the literature for the bandgap of AgInSe 2 ranging between 1.02 to 1.35 eV depending on the growth method and processing conditions. 20,24,25,27,28,30,42–47 However, the photoluminescence for our film is centered at 1.25 eV with a narrow FWHM of 59 meV, shown in Fig. 3d.…”
Section: Resultsmentioning
confidence: 77%
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“…Different values have been reported in the literature for the bandgap of AgInSe 2 ranging between 1.02 to 1.35 eV depending on the growth method and processing conditions. 20,24,25,27,28,30,42–47 However, the photoluminescence for our film is centered at 1.25 eV with a narrow FWHM of 59 meV, shown in Fig. 3d.…”
Section: Resultsmentioning
confidence: 77%
“…In most cases, AgInSe 2 films have been prepared using costly vacuum processing techniques. 20,[23][24][25][26][27][28][29][30] These techniques require a high vacuum, have inefficient material utilization, and involve batch processing. 31,32 Solution processing is a costeffective alternative for rapidly commercializing promising materials such as AgInSe 2 .…”
Section: Introductionmentioning
confidence: 99%
“…Mean relative errors [(calc – exp)/exp] in cell parameters compared to averaged experimental data depending on the density functional. Experimental data for ZnO, ZnS, , CdS, ,, CuInS 2 , CuInSe 2 , CuGaSe 2 , CuAlSe 2 , AgInSe 2 , CuGaS 2 , AgAlSe 2 , AgGaSe 2 , CdIn 2 S 4 , CZTSe, diamond, , and quartz. …”
Section: Resultsmentioning
confidence: 99%
“…Black dots mark the average in the experimental literature, and error bars are plotted between the minimum and maximum reported gap values. Experimental data for ZnO, ZnS, , CdS, ,, CuInS 2 , CuInSe 2 , CuGaSe 2 , CuAlSe 2 , AgInSe 2 , CuGaS 2 , AgAlSe 2 , AgGaSe 2 , CdIn 2 S 4 , CZTSe, diamond, , and quartz. .…”
Section: Resultsmentioning
confidence: 99%
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