2008
DOI: 10.1088/0960-1317/18/12/125020
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Processing of thin SU-8 films

Abstract: This paper summarizes the results of the process optimization for SU-8 films with thicknesses 5 μm. The influence of soft-bake conditions, exposure dose and post-exposure-bake parameters on residual film stress, structural stability and lithographic resolution was investigated. Conventionally, the SU-8 is soft-baked after spin coating to remove the solvent. After the exposure, a post-exposure bake at a high temperature T PEB 90 • C is required to cross-link the resist. However, for thin SU-8 films this often r… Show more

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Cited by 149 publications
(143 citation statements)
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“…8). This is because an increased exposure energy causes an increase in the material failure strength, thanks to stronger cross-linking 19 . We note that the maximum crack length may not be limited but the ultraviolet exposure time needs to increase to reduce the crack width and depth, resulting in the increase of development time.…”
Section: Resultsmentioning
confidence: 99%
“…8). This is because an increased exposure energy causes an increase in the material failure strength, thanks to stronger cross-linking 19 . We note that the maximum crack length may not be limited but the ultraviolet exposure time needs to increase to reduce the crack width and depth, resulting in the increase of development time.…”
Section: Resultsmentioning
confidence: 99%
“…This stress appears due to the different values of the coefficient of thermal expansion (CTE) between SU-8 and the used substrate. The expression to determine this value is [15]:…”
Section: Residual Thermal Stressmentioning
confidence: 99%
“…After solvent evaporation at room temperature for 3 h, the SU-8 layer was structured by a standard UV exposure (SUSS Mask Aligner MA6/BA6) and baked for 1 h at 50 °C [6]. The development was carried out in PGMEA for 2 x 2 min.…”
Section: Fabricationmentioning
confidence: 99%