2020
DOI: 10.1007/s00339-020-03629-9
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Processing influence in the CaCu3Ti4O12 electrical properties

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Cited by 7 publications
(5 citation statements)
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“…This EDS mapping result is similar to those of other reports of the LPS mechanism. 11,12,20 As reported in previous research, the microstructure of Mg 2+ doped CCTO ceramics fabricated using the SSR method and sintered at 1100 C had no signicant size difference. 28 Thus, the Mg 2+ dopant might not substantially impact grain size expansion at a relatively low sintering temperature of 1050 C. According to our previous work, the replacement of dopant at unexpected sites might be a signicant cause of these microstructural changes.…”
Section: Resultssupporting
confidence: 61%
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“…This EDS mapping result is similar to those of other reports of the LPS mechanism. 11,12,20 As reported in previous research, the microstructure of Mg 2+ doped CCTO ceramics fabricated using the SSR method and sintered at 1100 C had no signicant size difference. 28 Thus, the Mg 2+ dopant might not substantially impact grain size expansion at a relatively low sintering temperature of 1050 C. According to our previous work, the replacement of dopant at unexpected sites might be a signicant cause of these microstructural changes.…”
Section: Resultssupporting
confidence: 61%
“…The large increase in this ceramic grain size is likely associated with a liquid-phase sintering (LPS) mechanism. 11,12,20 As disclosed in Fig. 3, EDS mapping of the Mg05Al05 ceramic showed that Mg and Al elements have suitable dispersions.…”
Section: Resultsmentioning
confidence: 78%
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“…It is noteworthy that significant quantities of Cu-rich phases were found within the GB layers. The results derived from this EDS mapping are consistent with the findings documented in earlier studies exploring the LPS mechanism [44,45].…”
Section: Resultssupporting
confidence: 89%
“…It is noteworthy that significant quantities of Cu-rich phases were found within the GB layers. The results derived from this EDS mapping are consistent with the findings documented in earlier studies exploring the LPS mechanism[44,45].The dielectric characteristic of CCTO and Al0125 samples was studied. In the C p -tanδ measuring method, ε′ is computed as dC p /ε 0 A, where d and C p are the sample thickness and the relative capacitance, respectively.…”
supporting
confidence: 88%