a Lithium-ion batteries are being used in increasingly demanding applications where safety and reliability are of utmost importance. Thermal runaway presents the greatest safety hazard, and needs to be fully understood in order to progress towards safer cell and battery designs. Here, we demonstrate the application of an internal short circuiting device for controlled, on-demand, initiation of thermal runaway. Through its use, the location and timing of thermal runaway initiation is pre-determined, allowing analysis of the nucleation and propagation of failure within 18 650 cells through the use of high-speed X-ray imaging at 2000 frames per second. The cause of unfavourable occurrences such as sidewall rupture, cell bursting, and cell-to-cell propagation within modules is elucidated, and steps towards improved safety of 18 650 cells and batteries are discussed.
Broader contextFrom portable electronics to grid-scale storage, high energy density Li-ion batteries are ubiquitous in today's society. Such cells can and do fail, sometimes catastrophically, releasing large amounts of energy. To facilitate safer and more reliable cell designs, the importance of understanding failure mechanisms of Li-ion cells is widely recognised. Here, we demonstrate the application of a novel device that is capable of generating an internal short circuit within commercial cell designs, on-demand, and at a predetermined location. This enables us to test more effectively the ability of safety devices of cells and modules to withstand 'worst-case' failure scenarios. By combining the use of this device with high-speed X-ray imaging at 2000 frames per second, we characterise for the first time the initiation and propagation of thermal runaway from a known location within a Li-ion cell. The insights achieved in this study are expected to guide the design and development of safer and more reliable Li-ion cells.