2012
DOI: 10.1063/1.3699315
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Probing the oxygen vacancy distribution in resistive switching Fe-SrTiO3 metal-insulator-metal-structures by micro-x ray absorption near-edge structure

Abstract: Resistive switching metal-insulator-metal structures were fabricated from epitaxial Fe-doped SrTiO3 thin films to study the distribution of oxygen vacancies in a switched memristor cell using a micro-focused x-ray beam. In addition to the main filament, we found that the concentration of oxygen vacancies increases homogeneously over the whole electrode area during the electroforming procedure. The x-ray absorption near-edge structure (XANES) observed at the location of the filament exhibits distinct difference… Show more

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Cited by 45 publications
(28 citation statements)
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“…[1][2][3][4]13,15,30,32,38 ] In order to investigate the chemical states in a -STO thin fi lms and the impact of the compositional changes on the memristive behavior of a -STO MIM devices, a detailed analysis of the X-ray photoelectron spectroscopy (XPS)-binding energy spectra of the principal elements was carried out throughout the thickness of virgin and active devices (see Section S3, Supporting Information). [1][2][3][4]13,15,30,32,38 ] In order to investigate the chemical states in a -STO thin fi lms and the impact of the compositional changes on the memristive behavior of a -STO MIM devices, a detailed analysis of the X-ray photoelectron spectroscopy (XPS)-binding energy spectra of the principal elements was carried out throughout the thickness of virgin and active devices (see Section S3, Supporting Information).…”
Section: Defect Chemistry Of a -Sto Mim Cellsmentioning
confidence: 99%
“…[1][2][3][4]13,15,30,32,38 ] In order to investigate the chemical states in a -STO thin fi lms and the impact of the compositional changes on the memristive behavior of a -STO MIM devices, a detailed analysis of the X-ray photoelectron spectroscopy (XPS)-binding energy spectra of the principal elements was carried out throughout the thickness of virgin and active devices (see Section S3, Supporting Information). [1][2][3][4]13,15,30,32,38 ] In order to investigate the chemical states in a -STO thin fi lms and the impact of the compositional changes on the memristive behavior of a -STO MIM devices, a detailed analysis of the X-ray photoelectron spectroscopy (XPS)-binding energy spectra of the principal elements was carried out throughout the thickness of virgin and active devices (see Section S3, Supporting Information).…”
Section: Defect Chemistry Of a -Sto Mim Cellsmentioning
confidence: 99%
“…Since there is experimental evidence that the nominally acceptor-doped Fe:SrTiO 3 layer contains a large amount of donor-type oxygen vacancies generated during sample fabrication26, different distributions of acceptor-type and donor-type dopants of concentrations N A and N VO were considered in the I-layer.…”
mentioning
confidence: 99%
“…[22] The switching polarity has been consistently different with both dopants, Nb exhibiting eightwise polarity [22,23] and Fe counter-eightwise or both competing polarities. [25,29,32,33] Competing switching polarities dependent on the electrical field are possible in a single switching bit [25,29] and a debate in the literature has been ongoing about the switching mechanism in devices with the eightwise polarity. [19,34] Recently, Cooper et al proposed oxygen evolution and reincorporation into the high work function platinum electrode as the mechanism in undoped SrTiO 3 .…”
Section: Introductionmentioning
confidence: 99%