“…[1][2][3][4]13,15,30,32,38 ] In order to investigate the chemical states in a -STO thin fi lms and the impact of the compositional changes on the memristive behavior of a -STO MIM devices, a detailed analysis of the X-ray photoelectron spectroscopy (XPS)-binding energy spectra of the principal elements was carried out throughout the thickness of virgin and active devices (see Section S3, Supporting Information). [1][2][3][4]13,15,30,32,38 ] In order to investigate the chemical states in a -STO thin fi lms and the impact of the compositional changes on the memristive behavior of a -STO MIM devices, a detailed analysis of the X-ray photoelectron spectroscopy (XPS)-binding energy spectra of the principal elements was carried out throughout the thickness of virgin and active devices (see Section S3, Supporting Information).…”