1998
DOI: 10.1063/1.368454
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Probing nanodefects in fused silica by near-field scanning optical microscopy

Abstract: Nanodefects were artificially introduced into fused silica surface by n&o-indenting with a commercial atomic force microscope (AFM). The sample was illuminated at total internal refkction configuration and evanescent waves were detected by near-field scanning optical probe in the constant tip-sample separation mode. The strain fields associated with non-indents were attributed to the contrast mechanism in optical images. Thus the optical image directly maps out the strain distributions associated with these na… Show more

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Cited by 2 publications
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“…2(b), because the center of the pattern functioned as a PBG mirror. 16 These results indicate that there is an optimal ∆R value to achieve a high-Q-factor BE mode by balancing the horizontal loss and vertical loss.…”
mentioning
confidence: 83%
“…2(b), because the center of the pattern functioned as a PBG mirror. 16 These results indicate that there is an optimal ∆R value to achieve a high-Q-factor BE mode by balancing the horizontal loss and vertical loss.…”
mentioning
confidence: 83%
“…Recent studies have demonstrated the application of optical surface states of photonic crystals for guiding light, the formation of high-quality micro cavities, and sub-wavelength imaging [19,20,21]. We expect that the nonlinear tunable Tamm states found here would provide substantial nonlinearity-induced control within these applications leading to novel all-optical surface devices such as optical limiters and switches.…”
Section: Nonlinear Tamm Statesmentioning
confidence: 99%