Probe calibration of the scanning thermal microscope in the AC mode

Nanoscale heat transfer at contact between a hot tip and a substrate

“…In our previous papers [7][8][9], we identified the contact radius as being 1 micron when the tip temperature is larger than 100°C and about 200nm when it is lower. We presume that the change in the contact radius produces a change in the modes contributions.…”

Multifrequential AC modeling of the SThM probe behavior

“…In the vacuum case, the exchange coefficient have little influence, and the differences between the corresponding curves illuminates a result of the multifrequential approach: V (3ω)/I 3 b is a function of I b , contrary to the result given in Ref. [16].…”

“…Fig. 5 presents analytical responses f (ω) = V 3ω /I 3 b [7,16] for three currents (10, 33 and 50 mA), leading to important variations of the average temperature. For the air conditions, the exchange coefficient has been adapted for each current (average temperature) [13]: 700, 800 and 1150 W m −2 K −1 for the 10.04, 33.11 and 50.86 mA current, respectively; for the vacuum case, the values 7, 11 and 13 W m −2 K −1 have been retained.…”

Scanning Thermal Microscopy (SThM)

“…The many papers on applications of SThM published since 1995 have been accompanied by works on new probe types (Luo, Shi, Varesi, & Majumdar, 1997;Mills, Zhou, Midha, Donaldson, & Weaver, 1998;Janus et al, 2010;Zhang, Dobson, & Weaver, 2011;Tovee, Pumarol, Zeze, Kjoller, & Kolosov, 2012;Janus et al, 2014;Hofer et al, 2015), calibration methods (Lefèvre, Saulnier, Fuentes, & Volz, 2004;Dobson, Mills, & Weaver, 2005;Wielgoszewski, Babij, Szeloch, & Gotszalk, 2014), and attempts to improve the SThM technique itself (Oesterschulze & Stopka, 1996;Pollock & Hammiche, 2001;Kim et al, 2008;Wielgoszewski et al, 2011b;Juszczyk, Wojtol, & Bodzenta, 2013). To date, the greatest impact on the development of AFM-based thermal analysis comes from the following elements: • Development of microthermal analysis (μTA) (Pollock & Hammiche, 2001) and the closely related development of doped-silicon probes (discussed in the section entitled "Thermoresistive SThM Probes," later in this chapter), which enabled localized calometric measurements.…”