Multifrequential AC modeling of the SThM probe behavior

Grossel, Ph.; Raphaël, Olivier; Depasse, Françoise; Duvaut, Thierry; Trannoy, N.

doi:10.1016/j.ijthermalsci.2006.12.004

Cited by 21 publications

(10 citation statements)

References 15 publications

(28 reference statements)

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“…Compared to a thermocouple junction, the advantage of a resistive scanning thermal microscopy ͑SThM͒ probe remains its active mode of operation, which is still extensively studied. [5][6][7][8][9] The well known 3 method offers a direct way to extract a temperature component in ac mode of operation but the thermal signal is integrated all along the heated part of the probe. As a result, this method is not suited to point contact measurements.…”

Section: Introductionmentioning

confidence: 99%

Two omega method for active thermocouple microscopy

Thiéry

Gavignet

Cretin

2009

Review of Scientific Instruments

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We present a contribution to a new mode of scanning thermal microscopy (SThM) based on the use of thermoelectric junction operating in ac active mode. This is the first alternative to 3omega operating mode of a resistive SThM probe for measuring thermophysical parameters of materials at micro- and nanoscale. Whereas a current at omega frequency generates by Joule effect a 2omega thermal oscillation along the wires, the junction thermoelectric voltage can be measured by means of a differential bridge scheme associated to a lock-in amplifier. A thermal model is presented that confirms measurements performed in different situations with different wire probes. Values of thermal contact conductance of different materials have been extracted and a comparison has been performed between this technique and the resistive 3omega mode.

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Section: Introductionmentioning

confidence: 99%

Two omega method for active thermocouple microscopy

Thiéry

Gavignet

Cretin

2009

Review of Scientific Instruments

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“…19 For the 5 lm in diameter WTP, a value as high as h ¼ 2500 WÁm À2 ÁK À1 was found. 7,12 In static (dc) regime, the thermally thin condition is Bi < 0.1. In dynamic (ac) regime, the condition is L < l th , yielding an upper thermal modulation frequency 2f max ¼ D/(pL 2 ) (Eq.…”

Section: Lumped System Analysis and Finite Element Computationsmentioning

confidence: 99%

Reduced thermal quadrupole heat transport modeling in harmonic and transient regime scanning thermal microscopy using nanofabricated thermal probes

Bodzenta

Chirtoc

Juszczyk

2014

Journal of Applied Physics

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The thermal model of a nanofabricated thermal probe (NTP) used in scanning thermal microscopy is proposed. It is based on consideration of the heat exchange channels between electrically heated probe, a sample, and their surroundings, in transient and harmonic regimes. Three zones in the probe-sample system were distinguished and modeled by using electrical analogies of heat flow through a chain of quadrupoles built from thermal resistances and thermal capacitances. The analytical transfer functions for two- and three-cell quadrupoles are derived. A reduced thermal quadrupole with merged RC elements allows for thermo-electrical modeling of the complex architecture of a NTP, with a minimum of independent parameters (two resistance ratios and two time constants). The validity of the model is examined by comparing computed values of discrete RC elements with results of finite element simulations and with experimental data. It is proved that the model consisting of two or three-cell quadrupole is sufficient for accurate interpretation of experimental results. The bandwidth of the NTP is limited to 10 kHz. The performance in dc regime can be simply obtained in the limit of zero frequency. One concludes that the low NTP sensitivity to sample thermal conductivity is due, much like in dc regime, to significant heat by-pass by conduction through the cantilever, and to the presence of probe-sample contact resistance in series with the sample.

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“…The involvement of radiation in the heat balance is not significant compared to the natural convection with air [13]. A modelling of the thermal behaviour of the probe of the Scanning Thermal Microscope (SThM) has recently been proposed by Grossel et al [14]. The thermal exchange along the probe was modelled as a convection gradient of which the heat transfer coefficient value h is maximal at the periphery of the probe/sample contact area (with h = 1200 W/m 2 /K at the end of the probe in contact with the sample and h = 60 W/m 2 /K at the other end [15] …”

Section: Heat Exchange Between the Probe And The Samplementioning

confidence: 99%