Printed Circuit Board Design Methodology for Embedded Systems Targeting Space Applications

Rigo, Cezar Antônio; Seman, Laio Oriel; Berejuck, Marcelo Daniel; Bezerra, Eduardo Augusto

doi:10.1109/tla.2020.9085278

Cited by 2 publications

(1 citation statement)

References 0 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…To accomplish that, the other components on the HARSH board were selected due to their known degree of radiation sensitivity [20] and the board layout followed the applicable space-related criteria proposed by ESA guidelines (ECSS-Q-ST-70-12C). The guideline was not entirely fulfilled due to the proposed application scope of the HARSH board, resulting in a similar approach discussed in [21].…”

Section: A Devices Under Testmentioning

confidence: 99%

Technology Impact on Neutron-Induced Effects in SDRAMs: A Comparative Study

Luza

Söderström²,

Mattos

et al. 2021

2021 16th International Conference on Design &Amp; Technology of Integrated Systems in Nanoscale Era (DTIS)

Self Cite

View full text Add to dashboard Cite

This study analyses the response of synchronous dynamic random access memories to neutron irradiation. Three different generations of the same device with different node sizes (63, 72, and 110 nm) were characterized under an atmospheric-like neutron spectrum at the ChipIr beamline in the Rutherford Appleton Laboratories, UK. The memories were tested with a reduced refresh rate to expose more single-event upsets and under similar conditions provided by a board specifically developed for this type of study in test facilities. The board has also been designed to be used as a nanosatellite payload in order to perform similar tests. The neutron-induced failures were studied and characterized, presenting the occurrence of single-bit upsets and stuck bits. The cross sections for each type of event and technology node show that the 110 nm model is more sensitive to neutron-induced single-event effects than the other models.

show abstract

Section: A Devices Under Testmentioning

confidence: 99%