This study analyses the response of synchronous dynamic random access memories to neutron irradiation. Three different generations of the same device with different node sizes (63, 72, and 110 nm) were characterized under an atmospheric-like neutron spectrum at the ChipIr beamline in the Rutherford Appleton Laboratories, UK. The memories were tested with a reduced refresh rate to expose more single-event upsets and under similar conditions provided by a board specifically developed for this type of study in test facilities. The board has also been designed to be used as a nanosatellite payload in order to perform similar tests. The neutron-induced failures were studied and characterized, presenting the occurrence of single-bit upsets and stuck bits. The cross sections for each type of event and technology node show that the 110 nm model is more sensitive to neutron-induced single-event effects than the other models.
et al.. Pre-flight qualification test procedure for nanosatellites using sounding rockets. Acta Astronautica, Elsevier, 2019, 159, pp.Abstract This work presents an innovative procedure to test nanosatellites subsystems on board sounding rockets. The procedure allows the subsystems to save their telemetry data during the whole rocket flight phases (including at the rocket lift-off). The subsystems of the FloripaSat (1U CubeSat) engineering model have been tested on board a VSB-30 rocket in order to validate their design and integration process. A dedicated embedded system has been proposed to operate as an electronic interface between the nanosatellite subsystems and the rocket electronics. Also, a system to process telemetry data was implemented on * Corresponding author Email addresses: slongo@eel.ufsc.br (Leonardo Kessler Slongo), jgreis@lisha.ufsc.br (João Gabriel Reis), daniel.gaiki@studenti.polito.it (Daniel Gaiki), pedro@labtucal.ufsc.br (Pedro Von Hohendorff Seger), sara.vega@posgrad.ufsc.br (Sara Vega Martínez), bruno.eiterer@grad.ufsc.br (Bruno Vale Barbosa Eiterer), tulio.gomes.pereira@grad.ufsc.br (Tulio Gomes Pereira), mario.baldini@posgrad.ufsc.br (Mario Baldini Neto), m.frata@grad.ufsc.br (Matheus dos Santos Frata), henrique.hamisch@grad.ufsc.br (Henrique Daniel Hamisch),Subsystem (EPS); Telemetry, Tracking and Command (TT&C); and On Board Data Handling (OBDH). Several nanosatellites' functions have been evaluated, including: battery monitoring; inertial measurement unit; temperature measurements; radio transceiver; and beacon. The flight results were considerably different from the results obtained at the laboratory. This has allowed important modifications to be made on the design of the CubeSat flight model as the revision on the radio circuit on TT&C and the implementation of an external battery charger circuit for the EPS.Keywords: Test procedure, design validation, nanosatellite, sounding rocket 65 ditions. Even real nanosatellite missions can not provide data to this analysis, since the spacecrafts are placed in the P-POD (or equivalent launching device) during the flight, obligatorily in switch off condition. Laboratory qualification tests are essential, and they may be performed with the satellite subsystems collecting data. However, the physical phenomena are treated separately in 70 each test (vibration, acceleration, mechanical shock, temperature cycling, etc.), and normally, in a lower level of intensity (specially for nanosatellite projects).These are the reasons why this test procedure has been proposed, believing that new data may arise from these suborbital flights, which will help nanosatellite designers in their projects. 75 Besides the procedures of nanosatellite's subsystem configuration and integration, this paper also describes the design of the Multi-Mission Platform (MMP), which is an embedded system conceived to allow nanosatellite tests (and other experiments) aboard sounding rockets. This platform is based on a 4 180 experiment's goal is to test a thermal device, as wel...
Three SDRAMs from the same manufacturer with technology node sizes 110, 72, and 63 nm, were investigated under proton irradiation and using scanning electron microscopy (SEM). The radiation-induced faults were characterized and compared between the different part types. The devices under test (DUT) were irradiated with protons and experienced single event effects (SEE) in the form of stuck bits and single bit upsets (SBU). Analysis of the data retention times of bits which had SBU and were stuck during irradiation, showed similar patterns of retention time degradation, suggesting that the SBUs and stuck bits in all three part types could be induced by the same mechanism. Detailed data retention time analyses were also performed before and after irradiation to investigate the evolution of data retention times after irradiation, and after periods of annealing. The largest radiation-induced retention time losses were found to anneal, but the bits least affected directly after irradiation experienced decreasing data retention time as a function of annealing time. SEM imaging showed differences in the memory cell structure between the tested part types. The largest node size device was the most sensitive to the radiation, both for SEE and cumulative radiation effects.
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