2020
DOI: 10.1007/s11664-020-08096-9
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Preparation and Surface Characterization of Nanostructured MoO3/CoxOy and V2O5/CoxOy Interfacial Layers as Transparent Oxide Structures for Photoabsorption

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Cited by 16 publications
(9 citation statements)
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“…The result of the simulations gave the stoichiometric ratio of elements, compositions of layers and the film thickness of each sample. The RBS spectra are shown in figures (3) and the analysis presented in the table (1). Some important features could be inferred from the RBS analysis.…”
Section: Compositional Studymentioning
confidence: 96%
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“…The result of the simulations gave the stoichiometric ratio of elements, compositions of layers and the film thickness of each sample. The RBS spectra are shown in figures (3) and the analysis presented in the table (1). Some important features could be inferred from the RBS analysis.…”
Section: Compositional Studymentioning
confidence: 96%
“…However, beyond the lower limit value of bandgap, the structural characteristics of a material such as lattice distortions or disorder are capable of producing extended localized states in the energy gap of such materials leading to sub-bandgap absorption edge commonly called Urbach energy, E u . In this lower photon energy range, the spectral dependence of the absorption edge follows the empirical Urbach rule given by equation (3) [1,33] where α o and E c are material constants, E is the photon energy and E u denotes the width of the tail of localized states in the bandgap (Urbach energy)…”
Section: Urbach Energymentioning
confidence: 99%
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“…The Williamson-Hall curves of the Ag 2 S and In 2 S 3 are obtained by plotting βcosθ versus 4sinθ (figure S1). The slopes of the fitted straight lines by the plots demonstrates the intrinsic strain values of the deposited structures accordingly [38]. The intrinsic strains of Ag 2 S and In 2 S 3 calculated from the slope are −0.004 93 and −0.004 63, respectively, and the slope is negative, indicating the occurrence of lattice contraction [39].…”
Section: Crystal Structure and Microstructure Informationmentioning
confidence: 97%
“…To our knowledge, this study is being reported for the first time. Some surface properties of these structures have been investigated in one of our previous studies and the results showed that they are suitable and scalable materials for device fabrication [12].…”
Section: Introductionmentioning
confidence: 99%