“…Finally, samples were oven dried at 80 ºC before being further characterized. All samples were studied by X-ray diffraction (XRD, Rigaku, model RINT 2000), using CuKα radiation, in the 2θ range from 10º to 70º 26,27 . Morphological and structural characterizations of the selected samples were performed by transmission electron microscopy (TEM; Philips, model CM200) operated at 200 kV, and field emission scanning electron microscopy (SEM; JEOL, model 7500F).…”