2005
DOI: 10.1142/s0218625x05007074
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PREPARATION AND PHOTOVOLTAIC PROPERTIES OF Ag2O/Si ISOTYPE HETEROJUNCTION

Abstract: Highly (101)-oriented p-Ag 2 O thin film with high electrical resistivity was grown by rapid thermal oxidation (RTO) on clean monocrystalline p-type Si without any post-deposition annealing. From optical transmittance and absorptance data, the direct optical band gap was found to be 1.46 eV. The electrical and photovoltaic properties of Ag 2 O/Si isotype heterojunction were examined in the absence of any buffer layer. Ideality factor of heterojunction was found to be 3.9. Photoresponce result revealed that the… Show more

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Cited by 46 publications
(17 citation statements)
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“…The visible light incident on ZnO/Si heterojunction passes through ZnO layer, get absorbed by silicon substrate and then e-h pairs are generated near the ZnO-Si interface. 27 Figure 8 demonstrates the spectral responsivity ðR Þ plots of the ZnO/p-Si structure prepared at di®erent annealing times for the wavelength range (350-900) nm at 7.5 V reverse bias. There are two peaks of response located at 650 nm and 870 nm with maximum responsivity of 0.39 A/W at 875 nm for the photodetector annealed for 60 min.…”
Section: Resultsmentioning
confidence: 99%
“…The visible light incident on ZnO/Si heterojunction passes through ZnO layer, get absorbed by silicon substrate and then e-h pairs are generated near the ZnO-Si interface. 27 Figure 8 demonstrates the spectral responsivity ðR Þ plots of the ZnO/p-Si structure prepared at di®erent annealing times for the wavelength range (350-900) nm at 7.5 V reverse bias. There are two peaks of response located at 650 nm and 870 nm with maximum responsivity of 0.39 A/W at 875 nm for the photodetector annealed for 60 min.…”
Section: Resultsmentioning
confidence: 99%
“…It is suggested that the self‐redox reaction of Ag 2 O may occur under the influence of indoor light. Ag 2 O is a p‐type semiconductor 38. The photo‐generated electrons and holes in Ag 2 O may facilitate its redox reaction towards the formation of Ag NPs and oxygen gas, as indicated in Equations 2 and 3.…”
Section: Resultsmentioning
confidence: 99%
“…The effect of annealing duration on the ideality factor calculated forward bias I-V characteristic was observed is in the range of those reported for ITO/ poly(3,4,ethylenedioxythiophene):poly(styrenesulfonate) (PEDOT:PSS)/poly(2-methoxy-5-(2-ethlhexyloxy))-1,4-phenylenevinylene)(MEH-PPV)/Alq3/Lif/Au Schottky diode [24], and comparable to that those reported for ITO/MEH-PPV/A21 [28]. Large values of ideality factor were obtained due to the presence of recombination in the junction deposition or at junction interface [25], besides some structural defects and lattice mismatch between ZnO and CuGaO2 [19]. The improvement of the device performance is attributed to the smoother surface [26].…”
Section: Methodsmentioning
confidence: 62%