2007
DOI: 10.1016/j.jeurceramsoc.2006.05.092
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Preparation and characterization of SnO2 and Cu-doped SnO2 thin films using electrostatic spray deposition (ESD)

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Cited by 53 publications
(33 citation statements)
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“…For samples without template, the CuO peak was not as intense but still detectable for CuO loadings of as little as 1% as evidenced from the peak areas plotted in Fig. 2.This is contrary to the published work of several authors who could not detect the CuO phase in the XRD of SnO 2 :CuO samples [11,18,19,27,28]. The peak intensity was stronger with increasing Cu loading suggesting that at a low Cu content, CuO was present in the form of nanoparticles while at a high Cu content, bulk CuO agglomerated particles were present.…”
Section: X-ray Diffractioncontrasting
confidence: 68%
See 1 more Smart Citation
“…For samples without template, the CuO peak was not as intense but still detectable for CuO loadings of as little as 1% as evidenced from the peak areas plotted in Fig. 2.This is contrary to the published work of several authors who could not detect the CuO phase in the XRD of SnO 2 :CuO samples [11,18,19,27,28]. The peak intensity was stronger with increasing Cu loading suggesting that at a low Cu content, CuO was present in the form of nanoparticles while at a high Cu content, bulk CuO agglomerated particles were present.…”
Section: X-ray Diffractioncontrasting
confidence: 68%
“…Recently, we reported detailed investigations on the application of the Pechini method for the preparation of SrFeO X perovskite [16,17]. In this investigation we have used this method for the synthesis of SnO 2 :CuO hybrid for eventual sensor applications in the detection of H 2 S. The aim of this study was to characterize the CuO phase in SnO 2 :CuO, in view of the reported difficulty to detect CuO in the presence of SnO 2 at concentrations B5% [8,11,18,19]. The sample characterization was carried out by X-ray diffraction (XRD), X-ray photoelectron spectroscopy (XPS), scanning electron microscopy (SEM), infrared spectroscopy (IR) and nitrogen adsorption isotherms (BET).…”
Section: Introductionmentioning
confidence: 99%
“…The pore sizes are in the sub-micron range. The increase in porosity can be attributed to increased temperature and the film becomes denser without cracks at higher temperature [32], as observed in Figure 3(b). In this case, the pores shrink and the film surface subsequently becomes smooth.…”
Section: Effect Of Substrate Temperaturementioning
confidence: 75%
“…This result may be attributed to the limited evaporation of the droplets reaching the surface at low temperature. Some cracks are observed in the film due to thermal stress during the annealing process [32]. In addition, the precursor solution does not have sufficient time to form a continuous film on the Al 2 O 3 substrate.…”
Section: Effect Of Substrate Temperaturementioning
confidence: 99%
“…The most important of these compounds is tin dioxide [1][2][3][4][5], a typical wide band gap ntype semiconductor (3.6 eV for crystalline SnO 2 ), and one of the most widely used semiconductor oxides due to its chemical and mechanical stability. It can be used for many applications, such as gas sensors, solar collectors, transparent conductors and others.…”
Section: Introductionmentioning
confidence: 99%