2006
DOI: 10.1063/1.2337084
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Prediction of the thermal annealing of thick oxide metal-oxide-semiconductor dosimeters irradiated in a harsh radiation environment

Abstract: Radiation-sensing MOSFET transistors produced by the laboratory LAAS-CNRS were exposed to a harsh hadron field that represents the real radiation environment expected at the CERN Large Hadron Collider Experiments. The long-term stability of the transistor's I -V characteristic was investigated using the isochronal annealing technique. In this work, devices exposed to high intensity hadron levels (Φ ≥ 10 neutrons/cm ) show evidences of displacement damages in the I -V annealing behavior. By comparing experiment… Show more

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Cited by 5 publications
(3 citation statements)
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“…The recorded signal from RadFETs is the shift of the transistor threshold voltage that is converted to dose (Gy) following a power-low calibration curve , where and are experimental parameters. As showed in many works [8], [9] and in references therein, annealing phenomena [2] that affect the RadFETs selected in [11] are of the order of a few percent over years time-scale. For this reason the data presented in this work were not corrected for such a effect.…”
Section: B Devices Testedmentioning
confidence: 99%
See 1 more Smart Citation
“…The recorded signal from RadFETs is the shift of the transistor threshold voltage that is converted to dose (Gy) following a power-low calibration curve , where and are experimental parameters. As showed in many works [8], [9] and in references therein, annealing phenomena [2] that affect the RadFETs selected in [11] are of the order of a few percent over years time-scale. For this reason the data presented in this work were not corrected for such a effect.…”
Section: B Devices Testedmentioning
confidence: 99%
“…It is thus clear that the sensors for the LHC have to cover different sensitivities and a broad dynamic range in terms of TID and particle fluence as well as to comply with specific stability [8], [9] and response [10] requirements. For all these reasons, after intensive test campaigns, a series of four devices (two RadFETs and two p-i-n diodes) has been proved to fulfill LHC Experiments needs [11].…”
Section: Introductionmentioning
confidence: 99%
“…measured currents and voltages are converted to fluence by multiplying them with appropriate conversion constants. Measurements of long term annealing effects have been performed [12], [24], [25]. It was found that the annealing effects are significant for this application only for epi and BPW34 diodes.…”
Section: B Measurements With Diodesmentioning
confidence: 99%