Prediction of early lethal SEGR failures of VDMOSFETs for commercial space systems'

Titus, J.L.; Wheatley, C.F.; Wheatley, T.H.; Levinson, W.A.; Burton, D.I.; Barth, J.L.; Reed, Robert A.; LaBel, Kenneth A.; Howard, J.W.; Tyne, K.M. van

doi:10.1109/23.819133

Cited by 22 publications

(4 citation statements)

References 14 publications

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“…We will use a modification of the method proposed by Dashdondog et al [14], based on worst-case assumptions. This method is similar to that of Titus et al [15], as applied by Lauenstein et al [16].…”

Section: Estimate Of the Worst-case Failure Rate For Sic Power Mosfetmentioning

confidence: 89%

Failure Estimates for SiC Power MOSFETs in Space Electronics

et al. 2018

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Silicon carbide (SiC) power metal-oxide-semiconductor field effect transistors (MOSFETs) are space-ready in terms of typical reliability measures. However, single event burnout (SEB) due to heavy-ion irradiation often occurs at voltages 50% or lower than specified breakdown. Failure rates in space are estimated for burnout of 1200 V devices based on the experimental data for burnout and the expected heavy-ion linear energy transfer (LET) spectrum in space.

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Section: Estimate Of the Worst-case Failure Rate For Sic Power Mosfetmentioning

confidence: 89%

Failure Estimates for SiC Power MOSFETs in Space Electronics

et al. 2018

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“…If better tools are available to estimate MTBF for these devices, those may be used instead, resulting in a better accuracy and higher confidence. In particular, Titus et al [11] have discussed the failure rate for SEGR in more detail. Lacking more accurate estimating tools, it is imperative that conservative assumptions be used to ensure that the reliability estimate is conservative.…”

Section: Analysis Methodologymentioning

confidence: 99%

The Impact of Radiation-Induced Failure Mechanisms in Electronic Components on System Reliability

Mayer

Koga

Womack

2007

IEEE Trans. Nucl. Sci.

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“…These factors have increased interest in reliable destructive SEE rate estimation. [9][10][11][12][13] Such methods usually require estimation of at least the σ lim for failure or of σ vs. LET. Fig.…”

Section: Destructive Seementioning

confidence: 99%