Prediction of continuum intensity in energy-dispersive x-ray microanalysis

Fiori, Charles E.; Myklebust, Robert L.; Heinrich, Kurt F. J.; Yakowitz, H.

doi:10.1021/ac60365a022

Cited by 67 publications

(22 citation statements)

References 17 publications

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“…The combination resulted in the distribution reproduced as figure 46. Apparently, the distribution of characteristic and continuum x-rays of like energy is similar-not an altogether surprising result. 41 The study of the continuum distribution would be useful in studying background effects in energy dispersive x-ray detectors [41]. Monte Carlo calculations of this distribution might also be useful for analytical situations in which a small quantity of heavy material (high atomic number) resides in a light (low atomic number) matrix.…”

Section: Agreement With Experimental Results Was Very Good (Fig 43)mentioning

confidence: 99%

“…So far as f(x) vs x curves derived from Monte Carlo methods are concerned, Duncumb compared Monte Carlo results for Cu-Ka with those calculated by the Phi 1 i bert-DuncumbHeinrich relation [25]; results are shown in figure 41. This figure indicates the effect of tilt on the result as well thus illustrating the potential value of the Monte Carlo method in dealing with a wide variety of experimental arrangements.…”

Section: Distribution Of X-ray Signals By Monte Carlo Methodsmentioning

confidence: 99%

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Use of Monte Carlo calculations in electron probe microanalysis and scanning electron microscopy

Heinrich¹,

Newbury²,

Yakowitz³

1976

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Part of the mission of NBS is to disseminate knowledge in the scientific and technical community.To aid in reaching this objective, the Analytical Chemistry Division has sponsored a series of workshops on various topics in analytical chemistry. The workshop topics are chosen to fulfill current needs for detailed discussions on sharply defined subjects in a wide variety of specialist areas.The objective is to bring together specialists from throughout the world to concentrate intensively on a particular subject in order to advance the state-of-the-art.It is often very difficult to achieve this goal at large international meetings where the size and diversity of topics presented often limits detailed discussion of special subjects.Past topics of these workshops and the published proceedings include:Quantitative The workshop format consisted of a keynote talk on each topic followed by extensive discussions. The papers in this volume are based on the keynote talks augmented with some points raised in the discussion.The extensive development of electron beam instrumentation for the microscopy and analysis of samples of diverse scientific interest has resulted in a need for detailed studies of the origin and characteristics of the signals involved. This publication provides a detailed view of one approach to the study of such signals, namely the Monte Carlo technique for electron trajectory calculation.The publication should be of value to the numerous workers who utilize the scanning electron microscope and electron probe microanalyzer. The utility of electron probe microanalysis and scanning electron microscopy is demonstrated by the fact that more than 2500 such instruments costing from $25,000 to $200,000 are now in use worldwide, and more instruments are constantly being added. Moreover, the instruments are at work in fields as diverse as biology, metallurgy, electronics, chemistry, and forensic science.Simultaneously with the development and distribution of the instrumentation, much work has been devoted to the study of electron interactions with solids with the purpose of characterizing the signals which are utilized in microscopy and analysis.One approach which has proven especially useful in both qualitative and quantitative studies of electron interactions is that of Monte Carlo electron trajectory simulation.Monte Carlo calculations have enabled scientists to visualize the electron interaction volume in solids as to size and shape, to predict the parameters characterizing the secondary and back-scattered electrons, the x-rays, and the Auger electrons, and to analyze factors which determine resolution in micrographs.The purpose of the present workshop was to bring together a number of workers in Monte Carlo trajectory techniques to assess the current state of development and to look for areas of future development.The list of participants in the meeting does not include all active workers in the field, but we hope that this document contains a reasonably complete description of the subject.By examining the a...

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Section: Agreement With Experimental Results Was Very Good (Fig 43)mentioning

confidence: 99%

Section: Distribution Of X-ray Signals By Monte Carlo Methodsmentioning

confidence: 99%

Use of Monte Carlo calculations in electron probe microanalysis and scanning electron microscopy

Heinrich¹,

Newbury²,

Yakowitz³

1976

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“…Their number and energy distribution as a function of Z can be measured experimentally with a good degree of accuracy. The back scattered electron fraction T/ is given by (12) where ib is the incident beam current and is is the current measured through the specimen. Measurements of T/ by Bishop(36) and Heinrich (37) Igure .…”

Section: Electron Scatteringmentioning

confidence: 99%

“…The value of T/* can be determined easily if consecutive sample current measurements of the sample and a standard of known T/ are made at the same time the x-ray data are taken. From the definition of T/ in equation (12) and the fact that the beam current ib is the same for the two measurements, it follows that (47) With reasonably stable equipment, T/ * can be measured routinely to a precision of ±0.0l.…”

Section: Substrate Effectsmentioning

confidence: 99%

Electron Probe Microanalysis

Hutchins¹

1979

Surface and Colloid Science

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“…Estes dispositivos baseados no fenômeno de reflexão total consistem em finos tubos capilares dentro dos quais os feixes de raios X se propagam, refletindo-se totalmente sobre as paredes internas, sem sofrer atenuação ou dispersão. Estas são as microssondas de raios X que permitem análises de alta resolução espacial, da ordem de µm (FIORI et al, 1976;KUCZUMOW et al, 1996).…”

Section: Introductionunclassified

Determinação da concentração de elementos químicos potencialmente tóxicos em aerossóis presentes no interior de uma pequena indústria de fundição de metais, utilizando amostrador temporal e a técnica de fluorescência de raios X

Massoni¹

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Prediction of continuum intensity in energy-dispersive x-ray microanalysis

Cited by 67 publications

References 17 publications

Use of Monte Carlo calculations in electron probe microanalysis and scanning electron microscopy

Use of Monte Carlo calculations in electron probe microanalysis and scanning electron microscopy

Electron Probe Microanalysis

Determinação da concentração de elementos químicos potencialmente tóxicos em aerossóis presentes no interior de uma pequena indústria de fundição de metais, utilizando amostrador temporal e a técnica de fluorescência de raios X

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