Predicted and Observed Spectral Response from Collocated Shallow, Active- and Passive-Source Vs Data at Five ANSS Sites, Illinois and Indiana, USA

Odum, Jack K.; Stephenson, William J.; Williams, Robert A.

doi:10.1785/gssrl.81.6.955

Cited by 12 publications

(4 citation statements)

References 23 publications

(22 reference statements)

Supporting

Mentioning

Contrasting

Order By: Relevance

“…In a comparative study of surface-wave methods to borehole results, Comina et al (2011) concluded that for sites where the maximum wavelength (either active-or passive-source) is greater than 60 m, inversion nonuniqueness does not significantly affect the accuracy and reliability of the V S30 estimate. Collocated refraction/reflection and ReMi surveys in southern Illinois found that the difference in V S30 results between methods was 2% or less at four of the five sites with distinct rock-sediment V S contrasts (Odum et al, 2010).…”

Section: S30 and Nehrp Classificationmentioning

confidence: 94%

“…Active-source SH-wave (shear wave oriented in horizontal motion) seismic refraction/reflection profiling has been extensively used to obtain shallow V S data to depths of 50 m in a variety of geologic environments (Odum et al, , 2010Williams et al, 2003). In geologic environments where bedrock is shallow, this method is better at constraining the depth of high-impedance boundaries and bedrock V S .…”

Section: Data Acquisition and Processingmentioning

confidence: 99%

“…For a given site, the character and quality of each resulting dispersion image (individual transformed 30 s record) differ based on the transient ambient noise recorded during the 30 s interval. After p-f transformation and record stacking, we pick dispersion points that follow the lower-bound trend of the presumed fundamental-mode Rayleigh dispersion (e.g., Stephenson et al, 2005;Odum et al, 2010). The maximum depth of interpretation is governed primarily by array length, frequency content of the ambient surface waves, and the resonant frequency of the geophones.…”

Section: Refraction Microtremor Remi (Passive-source Surface-wave)mentioning

confidence: 99%

See 2 more Smart Citations

VS30 and Spectral Response from Collocated Shallow, Active-, and Passive-Source VS Data at 27 Sites in Puerto Rico

Odum

Stephenson

Williams

et al. 2013

Bulletin of the Seismological Society of America

Self Cite

View full text Add to dashboard Cite

Shear-wave velocity (V S ) and time-averaged shear-wave velocity to 30 m depth (V S30 ) are the key parameters used in seismic site response modeling and earthquake engineering design. Where V S data are limited, available data are often used to develop and refine map-based proxy models of V S30 for predicting ground-motion intensities. In this paper, we present shallow V S data from 27 sites in Puerto Rico. These data were acquired using a multimethod acquisition approach consisting of noninvasive, collocated, active-source body-wave (refraction/reflection), activesource surface wave at nine sites, and passive-source surface-wave refraction microtremor (ReMi) techniques. V S -versus-depth models are constructed and used to calculate spectral response plots for each site. Factors affecting method reliability are analyzed with respect to site-specific differences in bedrock V S and spectral response. At many but not all sites, body-and surface-wave methods generally determine similar depths to bedrock, and it is the difference in bedrock V S that influences site amplification. The predicted resonant frequencies for the majority of the sites are observed to be within a relatively narrow bandwidth of 1-3.5 Hz. For a first-order comparison of peak frequency position, predictive spectral response plots from eight sites are plotted along with seismograph instrument spectra derived from the time series of the 16 May 2010 Puerto Rico earthquake. We show how a multimethod acquisition approach using collocated arrays compliments and corroborates V S results, thus adding confidence that reliable site characterization information has been obtained.

show abstract

Section: S30 and Nehrp Classificationmentioning

confidence: 94%

Section: Data Acquisition and Processingmentioning

confidence: 99%

Section: Refraction Microtremor Remi (Passive-source Surface-wave)mentioning

confidence: 99%

See 1 more Smart Citation

VS30 and Spectral Response from Collocated Shallow, Active-, and Passive-Source VS Data at 27 Sites in Puerto Rico

Odum

Stephenson

Williams

et al. 2013

Bulletin of the Seismological Society of America

Self Cite

View full text Add to dashboard Cite

show abstract

“…A recent study of the 2008 M = 5.4 Mt. Carmel earthquake in Illinois showed site resonances in this range for USIN and EVIN, two seismic stations found within the study area (Odum et al 2010). On the other hand, at 1.0 s period, the higher amplifications are in the thickest soils within the ancient bedrock valley and extending to the north under the terrace alluvium deposits beneath Evansville.…”

Section: Table 2 Attenuation Relationships Used In the Scenario Grounmentioning

confidence: 69%

Earthquake Scenario Ground Motions for the Urban Area of Evansville, Indiana

Haase

Nowack

2011

Seismological Research Letters

View full text Add to dashboard Cite

Seismic scenario including site-effect determination in Torreperogil and Sabiote, Jaén (Spain), after the 2013 earthquake sequence

et al. 2015

View full text Add to dashboard Cite

Predicted and Observed Spectral Response from Collocated Shallow, Active- and Passive-Source Vs Data at Five ANSS Sites, Illinois and Indiana, USA

Cited by 12 publications

References 23 publications

VS30 and Spectral Response from Collocated Shallow, Active-, and Passive-Source VS Data at 27 Sites in Puerto Rico

VS30 and Spectral Response from Collocated Shallow, Active-, and Passive-Source VS Data at 27 Sites in Puerto Rico

Earthquake Scenario Ground Motions for the Urban Area of Evansville, Indiana

Seismic scenario including site-effect determination in Torreperogil and Sabiote, Jaén (Spain), after the 2013 earthquake sequence

Contact Info

Product

Resources

About