1989
DOI: 10.4028/www.scientific.net/msf.38-41.189
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Precipitation Phenomena in CMOS Technology

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Cited by 4 publications
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“…In our earlier work [7] the effects of crystal defects on the threshold voltage of MOS transistors were investigated. The transistors were in test chips located in matrix form on the wafers, but during processing the wafers had suffered severe warpage.…”
Section: Experlmental Detailsmentioning
confidence: 99%
“…In our earlier work [7] the effects of crystal defects on the threshold voltage of MOS transistors were investigated. The transistors were in test chips located in matrix form on the wafers, but during processing the wafers had suffered severe warpage.…”
Section: Experlmental Detailsmentioning
confidence: 99%
“…This is probably not seen in lower redshift targets because the central activity tends to be a smaller fraction of the total luminosity than in high redshift sources. Among the proposed explanations are that the emission lines arise from shock induced star formation (De Young 1989, Rees 1989 or that it is scattered light originating from the central nucleus (Fabian 1991). This is a crucial question in our understanding of how and when most star formation occured in giant elliptical galaxies and in clusters in general.…”
Section: Introductionmentioning
confidence: 99%