1985
DOI: 10.1016/0141-6359(85)90008-x
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Practical non-contact surface measuring instrument with one nanometre resolution

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Cited by 23 publications
(5 citation statements)
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“…In our experiments, tan u had a maximum value of 0.521. If β is less than 1 • , then tan u tan β = 9.1 × 10 − 3 1, and therefore the error caused by the tilt angle of a sample surface can be neglected.…”
Section: The Tilt Problemmentioning
confidence: 99%
See 1 more Smart Citation
“…In our experiments, tan u had a maximum value of 0.521. If β is less than 1 • , then tan u tan β = 9.1 × 10 − 3 1, and therefore the error caused by the tilt angle of a sample surface can be neglected.…”
Section: The Tilt Problemmentioning
confidence: 99%
“…The laser beam is focused on the sample surface by an objective lens. The focus information contained in the laser beam reflected from the sample surface can be transformed into variations in spot shape [3,4] and intensity [5] for detection. The signal from the photodetector is input to a servo focus-control system to adjust the position of the objective lens so that the focus spot is always on the sample surface.…”
Section: Introductionmentioning
confidence: 99%
“…An alternative option is the commercial infrared sensor [12,13] currently used on the inspection workstation in the AMRF. profiling [16,17] and ultrasonic profiling [10].…”
Section: Surface Texturementioning
confidence: 99%
“…The surface topographic techniques can be divided into three major categories: profiling techniques, area techniques, and microscopic techniques. The profiling techniques can also be separated into stylus profiling techniques [8], fringe-field capacitance [9], optical sectioning [10], interferometry [11], and focus detection [12]. The second category, area techniques, includes optical scattering [13], ultrasonic [14], and areal capacitance [15].…”
Section: Introductionmentioning
confidence: 99%