Power module lifetime estimation from chip temperature direct measurement in an automotive traction inverter

Coquery, G.; Carubelli, S.; Ousten, Jean-Pierre; Lallemand, Richard; Lecoq, Frederic; Lhotellier, Dominique; Viry, V. de; Dupuy, Philippe

doi:10.1016/s0026-2714(01)00197-4

Cited by 24 publications

(14 citation statements)

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“…These failures are mainly induced by power and thermal cycling of the semiconductor device [18]. For example, an interesting investigation conducted on a Renault Kangoo electric vehicle has been carried out in [19]. The authors have demonstrated that direct silicon temperature measurement of an operating traction inverter is feasible.…”

Section: Iipower Electronic Architecture Tolerant To Semiconductor Fmentioning

confidence: 99%

See 1 more Smart Citation

Space-Vector PWM Control Synthesis for an H-Bridge Drive in Electric Vehicles

Kolli¹,

Béthoux

Bernardinis³

et al. 2013

IEEE Trans. Veh. Technol.

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Abstract-This paper deals with a synthesis of Space Vector PWM control methods applied for a H-bridge inverter feeding a 3-phase Permanent Magnet Synchronous Machine in Electric Vehicle application. First, a short survey of existing power converter architectures, especially those adapted to degraded operating modes, is presented. Standard SVPWM control methods are compared with three innovative ones using EV-drive specifications in the normal operating mode. Then, a rigorous analysis of the margins left in the control strategy is presented for a semiconductor switch failure to fulfill degraded operating modes. Finally, both classic and innovative strategies are implemented in numerical simulation; their results are analyzed and discussed. Index Terms-Motor drives, Inverters, Space vector pulse width modulation (SVPWM), Permanent magnet machines, Semiconductor device reliability I.INTRODUCTIONPower converters are increasingly used in automotive applications for many reasons such as power conditioning, power management, and consumption reduction. As for any embedded transportation system, these power converters are subject to severe constraints especially regarding compactness and vehicle integration. More specifically electric vehicles (EVs) require a high degree of availability (continuity of service). In particular the constraining automotive environment is characterized by severe traction-braking cycles which induce power and thermal cycling during running phases of the vehicle [1]- [2]. Indeed, thermo-mechanical stresses have a significant impact on the lifetime power switches [3]. Consequently, there is a degradation of the semiconductor devices, which finally forces them into a failed state: short-circuit (SC) or open-circuit (OC) [2]. Such failures occurring on single power switches can affect the function of power converters and spread through the traction chain elements. It is then necessary to first isolate the fault, confine it and lastly reconfigure the control algorithms to operate in the presence of the fault. Obviously, the topology of the power converters or the power chain must be adapted to allow operation in degraded mode:-by associating a fourth additional half bridge in a three-phase inverter topology connected to the neutral point of the electric motor [4]. IFSTTAR/COSYS/LTN-Laboratoire des Technologies Nouvelles 2 LGEP-Laboratoire de Génie Electrique de Paris-by using multilevel inverters topologies used in a high power traction drive [5].-by redistributing the control efforts in a four-wheel independently driven electric vehicles [6]… Furthermore, faults may also happen on sensors and can be taken into account by active fault-tolerant control systems. For example in [7]-[8], authors consider a high-performance induction-motor drive for an EV or a hybrid one (HEV). The proposed systems detect a sensor loss or a sensor recovery and dynamically change its strategies to sustain the best control performances.Besides, faults may also occur in the electrical machine and can be considered using fa...

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Section: Iipower Electronic Architecture Tolerant To Semiconductor Fmentioning

confidence: 99%

“…The switching losses are an important part of the semiconductor power losses [44]. Reducing these losses is important to improve the inverter reliability because thermal stress is a key factor of the failure mechanism [19]. For the same reason, ensuring fair switching repartition is crucial.…”

Section: Control Drive Requirementsmentioning

confidence: 99%

Space-Vector PWM Control Synthesis for an H-Bridge Drive in Electric Vehicles

Kolli¹,

Béthoux

Bernardinis³

et al. 2013

IEEE Trans. Veh. Technol.

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show abstract

“…Fig. 4 shows the results from fitting Eqs (2)(3)(4)(5) to each phase of an individual pack for IGBTs (a) and diodes (b), respectively. From both graphs, a quite good description of the physical behaviour is observed in the 50 to 400 A range.…”

Section: Tsp Calibration At High Currentmentioning

confidence: 99%

“…While diodes are always working under this current value, IGBTs are usually over this current. Regardless of the real physical meaning of Eqs (2)(3)(4)(5), the temperature extraction can be accurately performed for low current ranges (up to 50 A per phase), in comparison to taking into account a linear relationship. However, Eqs.…”

Section: Tsp Calibration At High Currentmentioning

confidence: 99%

Temperature measurement on series resistance and devices in power packs based on on-state voltage drop monitoring at high current

Perpiñà

Serviere

Saiz

et al. 2006

Microelectronics Reliability

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“…Therefore, promoting thermal studies at chip level is fundamental for a better understanding of ERTC failures and for increasing its lifetime (Coquery et al, 2001). In fact, the key point is to monitor the temperature inside a power module under a thermal working condition representative of the final application.…”

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confidence: 99%