Power Measurement Setup Development for On-Wafer Characterization at 185–191 GHz

SiGe HBTs and BiCMOS Technology for Present and Future Millimeter-Wave Systems

“…Then, an ISS (Impedance Standard Substrate) kit is used to calibrate the measurement planes at the input of the on-wafer DUT, which means to consider the probe losses. A well-known integrated tuner has been measured to prove the high versatility of this test bench [19].…”