2006
DOI: 10.1016/j.microrel.2006.07.008
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Power cycling tests for accelerated ageing of ultracapacitors

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Cited by 12 publications
(3 citation statements)
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“…(i) Current profiles with high peak currents imply long rest periods when the root mean square (RMS) values of current are kept fixed [107]. High peak currents lead to high peak temperatures due to Joule heating during charge/discharge.…”
Section: Aging Testsmentioning
confidence: 99%
See 1 more Smart Citation
“…(i) Current profiles with high peak currents imply long rest periods when the root mean square (RMS) values of current are kept fixed [107]. High peak currents lead to high peak temperatures due to Joule heating during charge/discharge.…”
Section: Aging Testsmentioning
confidence: 99%
“…For instance, Briat et al [107] observed a 10 % reduction in capacitance after charge/discharge cycles of 200 A current for 417 h at 40°C on a commercial capacitor (Maxwell BCAP2600F). More examples are shown in Table 4.8.…”
Section: Aging Testsmentioning
confidence: 99%
“…As electronics is used in almost every area of human life, and as a result all of these areas being "safety critical", the prediction of the lifetime of electronic modules becomes an ever increasing necessity. This is especially true for aeronautics and automotive applications, where temperatures can sometimes well exceed the maximum guaranteed operating temperature for a particular component [5] [6].…”
Section: Introductionmentioning
confidence: 99%