2015
DOI: 10.1016/j.sna.2015.07.035
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Positioning control effectiveness of optical knife edge displacement sensor-embedded monolithic precision stage

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Cited by 24 publications
(5 citation statements)
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“…An optical interrupter (fixed emitter-detector pair with a moving knife edge to partially interrupt the beam) was used to measure the moving platform's motion during milling. Prior efforts have shown that the CMD can be successfully used for accurate force measurement compared to an industry-standard cutting force dynamometer (Kistler 9257B) [41][42][43]. Given the compliant nature of the CMD, it was necessary to explore the stability behavior.…”
Section: Discussionmentioning
confidence: 99%
See 1 more Smart Citation
“…An optical interrupter (fixed emitter-detector pair with a moving knife edge to partially interrupt the beam) was used to measure the moving platform's motion during milling. Prior efforts have shown that the CMD can be successfully used for accurate force measurement compared to an industry-standard cutting force dynamometer (Kistler 9257B) [41][42][43]. Given the compliant nature of the CMD, it was necessary to explore the stability behavior.…”
Section: Discussionmentioning
confidence: 99%
“…An optical interrupter (ROHM RPI-0352E) was selected as the measurement transducer ($0.33-$1.04/sensor). This simple LED-photodetector pair is used to measure displacement with high resolution at low cost using a knife edge [30][31][32][40][41][42][43] to partially block the light beam and, therefore, change the light intensity on the detector. The sensor has the added benefit of a compact footprint and fast response time (10 µs) without the need for an additional amplifier.…”
Section: Introductionmentioning
confidence: 99%
“…The knife-edge sensing techniques for dimensional measurement applications have been recently introduced [14][15][16][17]. In particular, Lee proposed a new linear displacement sensing method utilizing knife-edge diffraction (KED) [16,17]. An electromagnetic (EM) wave incident on the knife-edge gives rise to two waves, a transmitted wave and an edge-diffracted wave.…”
Section: Measurement Principlementioning
confidence: 99%
“…10 and provide more than a ±1.0mm range. It was fabricated by using a stereolithography process [17,28]. From the open-loop testing, the XY nanopositioning system was characterized: natural frequency (55.6 Hz/52.6 Hz) and damping ratio (0.14/0.09) along the X and Y axes, respectively.…”
Section: -2 Xy Systemmentioning
confidence: 99%
“…However, their measuring ranges are limited to a few tens of micrometers even though they achieved nanometer resolution because the detector was assumed to be a point. Also, Lee proposed a single axis flexure mechanism with a knife-edge based displacement sensor [16,17,28]. The lensed photodetectors were used to increase the measuring range, but it is limited to 500 μm and the resolution was 50 nm because of the lens effect.…”
Section: Introductionmentioning
confidence: 99%