1990
DOI: 10.1016/0022-2860(90)80045-l
|View full text |Cite
|
Sign up to set email alerts
|

Polytype analysis of SiC Powders by Raman spectroscopy

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1
1
1
1

Citation Types

0
3
0

Year Published

2003
2003
2022
2022

Publication Types

Select...
6

Relationship

0
6

Authors

Journals

citations
Cited by 12 publications
(4 citation statements)
references
References 5 publications
0
3
0
Order By: Relevance
“…Since the Raman scattering efficiency of SiC is relatively strong and signals with a high signal/noise ratio can be collected in a short time, Raman scattering spectroscopy has been used to identify polytype structures of SiC [30][31][32]. In addition, the folded modes of the transverse optic (FTO) and acoustic phonon (FTA) branches for different SiC polytypes are separately located.…”
Section: Effects Of B 4 C On the Phase Composition Of Porous Sic Ceramentioning
confidence: 99%
“…Since the Raman scattering efficiency of SiC is relatively strong and signals with a high signal/noise ratio can be collected in a short time, Raman scattering spectroscopy has been used to identify polytype structures of SiC [30][31][32]. In addition, the folded modes of the transverse optic (FTO) and acoustic phonon (FTA) branches for different SiC polytypes are separately located.…”
Section: Effects Of B 4 C On the Phase Composition Of Porous Sic Ceramentioning
confidence: 99%
“…There are only a few reports on the Raman investigation of polytype domains (domains with a single polytype structure) in SiC ceramics and powders. [27][28][29] It is of interest to examine to what extent the Raman scattering can be applied to the structural analysis of SiC ceramics and to compare the results of Raman and XRD measurements. In this paper we have tried to determine the contents of the polytype domains of SiC ceramics made under various conditions and compare those with the results of XRD analysis.…”
Section: Introductionmentioning
confidence: 99%
“…5(b) from the point II. The sharp peaks in the region of 750-800 cm 1 (at 767, 788, and 796 cm 1 ) represent the transversal optical modes and that at 964 cm 1 the longitudinal optical modes of the polycrystalline SiC [28]. Also the bands of the graphite are detectable as D-peak at 1359 cm 1 and the G-peak at 1591 cm 1 [29].…”
Section: 1 Uninjured Surface Of Sicmentioning
confidence: 91%