Raman Scattering Characterization of Polytype in Silicon Carbide Ceramics: Comparison with X‐ray Diffraction

Abstract

Raman scattering measurements have been made on SiC ceramics prepared from two powdered by sintering at different temperatures. The Raman spectra of starting powders have also been measured. The volume contents of the 4H and 15R polytype phases relative to that of the 6H phase in the ceramics are inferred from the Raman intensity of folded modes of the acoustic branches and compared with those determined from X-ray diffraction (XRD) analysis. A strong correlation is found between the results obtained from the two analyses. The 4H polytype contents estimated by Raman measurement for specimens prepared from one powder show a good agreement with those obtained by the XRD analysis. For the 15R polytype component there is a correlation between the contents inferred by the two techniques when the content is not very small. The results obtained by the two techniques demonstrate that the Raman spectroscopy as well as the XRD analysis is useful to study the natures and preparation conditions of SiC ceramics. N. P. Padture-contributing editor Manuscript No. 187808.

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