2008
DOI: 10.1016/j.tsf.2007.09.030
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Polycrystalline AlN films with preferential orientation by plasma enhanced chemical vapor deposition

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Cited by 13 publications
(9 citation statements)
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References 21 publications
(37 reference statements)
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“…This further supports the occurrence of p-ZnO as observed earlier in our Hall measurement and XRD results. There is a peak around 2357 cm À1 , which is not attributed to any of the possible bonds such as Zn-O, Al-O, Al-N. With an observation of similar peak at around 2150 cm À1 in AlN films, Sanchez et al [28] has reported that this has been assigned to the multiple impurity bond of nitrogen.…”
Section: Ftir Studiesmentioning
confidence: 96%
“…This further supports the occurrence of p-ZnO as observed earlier in our Hall measurement and XRD results. There is a peak around 2357 cm À1 , which is not attributed to any of the possible bonds such as Zn-O, Al-O, Al-N. With an observation of similar peak at around 2150 cm À1 in AlN films, Sanchez et al [28] has reported that this has been assigned to the multiple impurity bond of nitrogen.…”
Section: Ftir Studiesmentioning
confidence: 96%
“…In addition, the absorption peak of Al−N bond is observed at 672 cm −1 . 46 This implies that AlN nanoparticles were released from AlN/SCF/EP bulk composite and compacted into the tribofilm.…”
Section: ■ Experimental Sectionmentioning
confidence: 99%
“…The AlN films were deposited by many methods such as RF magnetron sputtering [6], microwave plasma enhanced chemical vapor deposition [7], DC reactive magnetron sputtering [8] molecular beam epitaxy [9,10], ion beam-assisted deposition [11] and plasma assisted CVD [12]. Among these methods sputtering is an important industrial method for the fabrication of thin films for device fabrication purpose.…”
Section: Introductionmentioning
confidence: 99%