2012 Symposium on VLSI Technology (VLSIT) 2012
DOI: 10.1109/vlsit.2012.6242485
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Poly/high-k/SiON gate stack and novel profile engineering dedicated for ultralow-voltage silicon-on-thin-BOX (SOTB) CMOS operation

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Cited by 23 publications
(25 citation statements)
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“…For breaking through the tight trade-off between active (operation) and standby (leakage) current of transistors to reduce total current consumption, SOI (Silicon on Insulator) based process technologies are considered as good candidates. SOTB process [26], [27] is one of the most promising among them and actual shipment of products developed with SOTB process has been already started [28]. As summarized in Fig.…”
Section: Extremely Low Energy Solution With Sotb (Silicon On Thin Burmentioning
confidence: 99%
“…For breaking through the tight trade-off between active (operation) and standby (leakage) current of transistors to reduce total current consumption, SOI (Silicon on Insulator) based process technologies are considered as good candidates. SOTB process [26], [27] is one of the most promising among them and actual shipment of products developed with SOTB process has been already started [28]. As summarized in Fig.…”
Section: Extremely Low Energy Solution With Sotb (Silicon On Thin Burmentioning
confidence: 99%
“…thin BOX layer and doped ground plane (n GP and p GP) just below the BOX layer; (iii) flexible V th tuning by impurity density control of the ground plane and (iv) high design compatibility with the conventional CMOS due to mostly identical planar layout to the bulk and a hybrid bulk integration for I/O. Details of the SOTB fabrication process are reported elsewhere [15,16]. Figure 3.…”
Section: Sotb Device Technologymentioning
confidence: 99%
“…V th control optimized for the ULV operation has been an important process issue. In this optimization, we controlled the V th values at around 0.2 V, which is by about 0.2 V lower than that for the low-standby-power (LSTP) application, with the multiple V th option utilizing a poly-silicon and high-k gate-stack technology and a proper doping profile control of the ground plane [15]. As shown in Figure 4, we utilize a small amount of high-k (Hf and Al) oxide mixed with the conventional SiON gate dielectric and control proper effective work function (EWF) both for NMOS and PMOS.…”
Section: Sotb Device Technologymentioning
confidence: 99%
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“…We choose poly-silicon/high-k/SiON gate stack because it has adequate EWF (around quarter gap) for the ULV operation and its fabrication process is cost effective. Moreover, we implemented a novel impurity-profile engineering named local ground plane (LGP) (9) to improve the V th controllability, drain parasitic capacitance, and robustness against the gate-length variation. As shown in Fig.…”
Section: Transistor Optimization For Ulv Operationmentioning
confidence: 99%