Polishing-induced contamination of fused silica optics and laser induced damage density at 351 nm

Néauport, Jérôme; Lamaignère, Laurent; Bercegol, Herve; Pilon, Fabien; Birolleau, Jean-Claude

doi:10.1364/opex.13.010163

Cited by 203 publications

(96 citation statements)

References 17 publications

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“…We can also notice that for the samples with low CeO 2 contents (S2, S3, and S4), this correlation is weaker, and it has a good agreement with experimental data on CeO 2 contents dependence of damage density. 26 In the case of CeO 2 impurities, as the dramatic decrease of the contents from samples S1 to S4, the damage density will decrease according to our calculation. As a consequence, the damage probability induced by the laser pulse with same fluence will decrease.…”

Section: Methodsmentioning

confidence: 55%

Effect of subsurface impurities of fused silica on laser-induced damage probability

et al. 2014

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Abstract. A thermal model coupled to statistics is proposed based on damage initiation by heating of sizedistributed inclusions to a critical temperature. The data points of damage probability on the surface of fused silica containing different levels of impurities are measured. By linking the contents of various impurities measured to the calculation for damage probability, the influence of various impurities on damage probability is obtained. The purpose of the work is to present a more thorough analysis of the correlation of subsurface impurities to laser damage probability.

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Section: Methodsmentioning

confidence: 55%

Effect of subsurface impurities of fused silica on laser-induced damage probability

et al. 2014

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“…Under the combined work of mechanical and chemical actions, the optical materials are removed, leaving the subsurface damage (SSD) distributed beneath the polished surface. The SSD distribution profile is presented in Figure 2, which includes re-deposition, defect and deformed layers [17,26,31,43]. The re-deposition layer consists of impurity defects and silica compounds, resulting from the hydrolysis reaction of fused silica.…”

Section: Sample Preparation Ssd Removal and Etching Process Charactmentioning

confidence: 99%

“…With the application of advanced testing techniques like synchrotron radiation X-ray fluorescence (SXRF) and secondary ion mass spectrometry (SIMS), it has been previously reported [17,18,20,22,25] that the precision grinding and polishing of optical materials can probably introduce impurity defects with sub-wavelength size on the processed surface or subsurface. The impurity defects mainly contain cerium oxide (CeO 2 ), zirconium dioxide (ZrO 2 ), iron (Fe), aluminum (Al), chromium (Cr) and so on [17,20,25].…”

Section: Introductionmentioning

confidence: 99%

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Effect of Polishing-Induced Subsurface Impurity Defects on Laser Damage Resistance of Fused Silica Optics and Their Removal with HF Acid Etching

et al. 2017

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Laser-induced damage on fused silica optics remains a major issue that limits the promotion of energy output of large laser systems. Subsurface impurity defects inevitably introduced in the practical polishing process incur strong thermal absorption for incident lasers, seriously lowering the laser-induced damage threshold (LIDT). Here, we simulate the temperature and thermal stress distributions involved in the laser irradiation process to investigate the effect of impurity defects on laser damage resistance. Then, HF-based etchants (HF:NH 4 F) are applied to remove the subsurface impurity defects and the surface quality, impurity contents and laser damage resistance of etched silica surfaces are tested. The results indicate that the presence of impurity defects could induce a dramatic rise of local temperature and thermal stress. The maximum temperature and stress can reach up to 7073 K and 8739 MPa, respectively, far higher than the melting point and compressive strength of fused silica, resulting in serious laser damage. The effect of impurity defects on laser damage resistance is dependent on the species, size and spatial location of the defects, and CeO 2 defects play a dominant role in lowering the LIDT, followed by Fe and Al defects. CeO 2 defects with radius of 0.3 µm, which reside 0.15 µm beneath the surface, are the most dangerous defects for incurring laser damage. By HF acid etching, the negative effect of impurity defects on laser damage resistance could be effectively mitigated. It is validated that with HF acid etching, the number of dangerous CeO 2 defects is decreased by more than half, and the LIDT could be improved to 27.1 J/cm 2 .

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“…Beckwitt et al [6] used cascade quadratic nonlinearity to compensate self-focusing. Another factor influencing the intensity is defects in the optical elements [7,8] . The presence of defects may lead to a more complex intensity distribution and worse beam quality, and may even cause small-scale self-focusing which may damage optical elements [9,10] .…”

Section: Introductionmentioning

confidence: 99%

Propagation characteristics of a high-power broadband laser beam passing through a nonlinear optical medium with defects

Chen

et al. 2013

High Pow Laser Sci Eng

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The intensity distributions of a high-power broadband laser beam passing through a nonlinear optical medium with defects and then propagating in free space are investigated based on the general nonlinear Schrödinger equation and the split-step Fourier numerical method. The influences of the bandwidth of the laser beam, the thickness of the medium, and the defects on the light intensity distribution are revealed. We find that the nonlinear optical effect can be suppressed and that the uniformity of the beam can be improved for a high-power broadband laser beam with appropriate wide bandwidth. It is also found that, under the same incident light intensity, a thicker medium will lead to a stronger self-focusing intensity, and that the influence of defects in the optical elements on the intensity is stronger for a narrowband beam than for a broadband beam.

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Polishing-induced contamination of fused silica optics and laser induced damage density at 351 nm

Cited by 203 publications

References 17 publications

Effect of subsurface impurities of fused silica on laser-induced damage probability

Effect of subsurface impurities of fused silica on laser-induced damage probability

Effect of Polishing-Induced Subsurface Impurity Defects on Laser Damage Resistance of Fused Silica Optics and Their Removal with HF Acid Etching

Propagation characteristics of a high-power broadband laser beam passing through a nonlinear optical medium with defects

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