1997
DOI: 10.1143/jpsj.66.1351
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Polarized XAFS Study of KNbO3Local Structure

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Cited by 6 publications
(4 citation statements)
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“…In disagreement with our XAFS results, Shuvaeva, et al [37,38], using polarized XAFS and X-ray diffraction measurements of the single crystal KNbO3 at room temperature, obtained that the direction of the local Nb atom off-center displacement agrees closely with the direction of the [110] polar axis in the orthorhombic phase. The error analysis, however, was not performed.…”
Section: Discussioncontrasting
confidence: 99%
See 1 more Smart Citation
“…In disagreement with our XAFS results, Shuvaeva, et al [37,38], using polarized XAFS and X-ray diffraction measurements of the single crystal KNbO3 at room temperature, obtained that the direction of the local Nb atom off-center displacement agrees closely with the direction of the [110] polar axis in the orthorhombic phase. The error analysis, however, was not performed.…”
Section: Discussioncontrasting
confidence: 99%
“…The quality of the fits reported in Ref. [37] indicates that the uncertainties in the obtained parameters (due to noise in the data or lack of spatial resolution) may have been too large to convincingly discriminate between the [110] and [111] directions of Nb atom disl)lacements.…”
Section: Discussionmentioning
confidence: 99%
“…In addition, a more recent femtosecond time-resolved spectroscopy study for this phase rule out relaxational contributions of the same symmetry as the soft mode [10] . Also, other XAFS measurements at room temperature revealed that the direction of the Nb displacement is as close to the polar axis as the order of temperature atomic displacements [11] .…”
Section: Introductionmentioning
confidence: 80%
“…The artifacts considerably distort the spectra and can introduce significant errors into results. In the case of Bragg reflections the problem is usually solved by applying special experimental approaches such as the oscillating of samples (Revenant-Brizard et al, 1997), adjustment of single crystal sample to avoid the presence of Bragg reflections in the wavelength region of interest (Shuvaeva et al, 1997) or by using oriented polycrystalline samples for polarized XAFS studies (Yang et al, 1988). However, these methods require special experimental equipment or sample preparation techniques and are not applicable in some cases.…”
Section: Introductionmentioning
confidence: 99%