2001
DOI: 10.1107/s0909049500020951
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Deglitching procedure for XAFS

Abstract: A computer program for eliminating artifacts such as glitches and Bragg peaks of the polarized XAFS spectra is presented. It permits to easily locate and to eliminate from the EXAFS spectra the additional signals originated from the Bragg scattering by crystalline samples. The test of the procedure on the spectra with specially introduced artifacts and on the experimental polarized XAFS spectra showed its high effectiveness.

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Cited by 4 publications
(4 citation statements)
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“…The traditional field of application for devices that solve such problems are: radars [1], communication systems [2], [3] and electronic intelligence [4]. However, the range of applications much wider and includes, for example, the assessment of the parameters of X-Ray absorption spectra [5], Bragg scattering [6], plasma parameters [7,35], assessment of the stability of the information system [8], the solution of the problem of the parameter estimation for in-line flaw detection [9], or the development of an optoelectronic displacement sensors [10], which are used in the oil and gas industry.…”
Section: Introductionmentioning
confidence: 99%
“…The traditional field of application for devices that solve such problems are: radars [1], communication systems [2], [3] and electronic intelligence [4]. However, the range of applications much wider and includes, for example, the assessment of the parameters of X-Ray absorption spectra [5], Bragg scattering [6], plasma parameters [7,35], assessment of the stability of the information system [8], the solution of the problem of the parameter estimation for in-line flaw detection [9], or the development of an optoelectronic displacement sensors [10], which are used in the oil and gas industry.…”
Section: Introductionmentioning
confidence: 99%
“…At the same time, there is a growing demand for the synthesis of new algorithms for solving problems of estimating signal parameters in a wide range of applications: radars 2 , communication systems 3 , 4 , electronic intelligence 5 , X-Ray absorption spectra 6 , Bragg scattering 7 , plasma parameters estimation 8 , 9 , assessment of the stability of information systems 10 , the solution of the problem of parameter estimation for in-tube flaw detection 11 , the development of optoelectronic displacement sensors 12 , etc. The requirements for the accuracy of the assessment and its reliability are increasing, which determines both the use of more productive computing resources and determines the relevance of the search for new information processing algorithms.…”
Section: Introductionmentioning
confidence: 99%
“…A rapid and robust method for automated deglitching of XAS spectra is needed to address this shortcoming. Previous methods with greater potential for automation used the first derivative of the absorption coefficient to identify glitches (Zhuchkov et al, 2001). While useful, such strategies can result in points adjacent to glitches being erroneously identified, and the applicability to the X-ray absorption near-edge structure (XANES) region is limited.…”
Section: Introductionmentioning
confidence: 99%