2009
DOI: 10.1016/j.jmmm.2008.11.100
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Polarized current changes the exchange bias in a current-in-plane spin valve

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Cited by 9 publications
(1 citation statement)
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“…However, because of scattering processes, conduction electron flow is not confined to specific layers of the EBSV structure, but can move from layer to layer, thereby transferring spin angular momentum between the layers. In a series of papers, Tang et al [30][31][32][33][34][35] reported on the effects of high CIP currents on the exchange bias in room-temperature experiments. They used a standard four-probe method to measure CIP-MR of sputtered EBSV of the form F/N/F/AFM with free F = 10-12 nm of NiFe, N = 4 nm of Cu, pinned F = 3-12 nm of NiFe and AFM = 15 nm of FeMn.…”
Section: Initial Experiments: Antiferromagnetic Spin-transfer Torque-current-in-plane Experimentsmentioning
confidence: 99%
“…However, because of scattering processes, conduction electron flow is not confined to specific layers of the EBSV structure, but can move from layer to layer, thereby transferring spin angular momentum between the layers. In a series of papers, Tang et al [30][31][32][33][34][35] reported on the effects of high CIP currents on the exchange bias in room-temperature experiments. They used a standard four-probe method to measure CIP-MR of sputtered EBSV of the form F/N/F/AFM with free F = 10-12 nm of NiFe, N = 4 nm of Cu, pinned F = 3-12 nm of NiFe and AFM = 15 nm of FeMn.…”
Section: Initial Experiments: Antiferromagnetic Spin-transfer Torque-current-in-plane Experimentsmentioning
confidence: 99%